Winkelmann, Aimo - Publications & Citations

Winkelmann, Aimo

AGH University of Krakow

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收录论文 47

发表时间

Simulation-Based Super-Resolution Kikuchi Pattern Analysis

Microscopy and Microanalysis

IF3

2025-07-25

PREAI

Aimo Winkelmann; Grzegorz Cios; Konrad Perzyński; Tomasz Tokarski; Klaus Mehnert; Łukasz Madej; Piotr Bała

Pattern matching workflows for EBSD data analysis: Quartz chirality mapping EBSD数据分析的模式匹配工作流程：石英手性映射

MATERIALS CHARACTERIZATION

IF5.5

2025-06-01

PREAI

Cios, Grzegorz; Winkelmann, Aimo; Tokarski, Tomasz; Bala, Piotr

Strain-Induced Modifications of Thin Film Silicon Membranes Through Physical Bending 通过物理弯曲引起的应变诱导对薄膜硅膜片的改性

MATERIALS

IF3.2

2025-05-17

OAAI

Margariti, Eleni; Bruckbauer, Jochen; Winkelmann, Aimo; Guilhabert, Benoit; Gunasekar, Naresh-Kumar; Trager-Cowan, Carol; Martin, Robert; Strain, Michael

Evaluating the single crystallinity of sea urchin calcite 评估海胆方解石的单晶性

ACTA BIOMATERIALIA

IF9.6

2025-05-01

OAAI

Hoerl, S; Griesshaber, E; Checa, AG; Winkelmann, A; Förster, F; Alsheikha, O; Hidalgo, F; Sturm, E; Jahn, S; Schmahl, WW

Enantiomorph conversion in single crystals of the Weyl semimetal CoSi

COMMUNICATIONS MATERIALS

IF9.6

2023-12-19

OAAI

Carrillo-Cabrera, Wilder; Simon, Paul; Schmidt, Marcus; Koenig, Markus; Borrmann, Horst; Winkelmann, Aimo; Burkhardt, Ulrich; Grin, Yuri

Active sites of Te-hyperdoped silicon by hard x-ray photoelectron spectroscopy

APPLIED PHYSICS LETTERS

IF3.6

2023-06-23

OAAI

Hoesch, Moritz; Fedchenko, Olena; Wang, Mao; Schlueter, Christoph; Potorochin, Dmitrii; Medjanik, Katerina; Babenkov, Sergey; Ciobanu, Anca S.; Winkelmann, Aimo; Elmers, Hans-Joachim; Zhou, Shengqiang; Helm, Manfred; Schoenhense, Gerd

Assignment of chiral elemental crystal structures using Kikuchi diffraction

MATERIALS CHARACTERIZATION

IF5.5

2023-02-01

PREAI

Winkelmann, Aimo; Cios, Grzegorz; Tokarski, Tomasz; Bala, Piotr; Grin, Yuri; Burkhardt, Ulrich

Correlation of Heterogeneous Local Martensite Tetragonality and Carbon Distribution in High Carbon Steel

MATERIALS

IF3.2

2022-09-25

OAAI

Kohne, Thomas; Dahlstrom, Alexander; Winkelmann, Aimo; Hedstrom, Peter; Borgenstam, Annika

Domain structure of pseudosymmetric η-ordered Cu6Sn5 by EBSD analysis

ACTA MATERIALIA

IF9.3

2022-05-01

PREAI

Martin, S.; Winkelmann, A.; Leineweber, A.

Bulk spin polarization of magnetite from spin-resolved hard x-ray photoelectron spectroscopy

PHYSICAL REVIEW B

IF3.7

2021-07-19

OAAI

Schmitt, M.; Kirilmaz, O.; Chernov, S.; Babenkov, S.; Vasilyev, D.; Fedchenko, O.; Medjanik, K.; Matveyev, Yu; Gloskovskii, A.; Schlueter, C.; Winkelmann, A.; Dudy, L.; Elmers, H-J; Schoenhense, G.; Sing, M.; Claessen, R.

Assignment of enantiomorphs for the chiral allotrope β-Mn by diffraction methods

SCIENCE ADVANCES

IF12.5

2021-05-14

OAAI

Burkhardt, Ulrich; Winkelmann, Aimo; Borrmann, Horst; Dumitriu, Andreea; Koenig, Markus; Cios, Grzegorz; Grin, Yuri

Tetragonality mapping of martensite in a high-carbon steel by EBSD

MATERIALS CHARACTERIZATION

IF5.5

2021-05-01

OAAI

Nolze, Gert; Winkelmann, Aimo; Cios, Grzegorz; Tokarski, Tomasz

Correlating Crystallographic Orientation and Ferroic Properties of Twin Domains in Metal Halide Perovskites

ACS NANO

IF16

2021-03-26

OAAI

Liu, Yongtao; Trimby, Patrick; Collins, Liam; Ahmadi, Mahshid; Winkelmann, Aimo; Proksch, Roger; Ovchinnikova, Olga S.

Site-specific atomic order and band structure tailoring in the diluted magnetic semiconductor (In,Ga,Mn)As

PHYSICAL REVIEW B

IF3.7

2021-02-02

OAAI

Medjanik, K.; Fedchenko, O.; Yastrubchak, O.; Sadowski, J.; Sawicki, M.; Gluba, L.; Vasilyev, D.; Babenkov, S.; Chernov, S.; Winkelmann, A.; Elmers, H. J.; Schoenhense, G.

Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps

MATERIALS

IF3.2

2020-06-23

OAAI

Winkelmann, Aimo; Nolze, Gert; Cios, Grzegorz; Tokarski, Tomasz; Bala, Piotr

EBSD orientation analysis based on experimental Kikuchi reference patterns

ACTA MATERIALIA

IF9.3

2020-04-01

OAAI

Winkelmann, Aimo; Cios, Grzegorz; Tokarski, Tomasz; Nolze, Gert; Hielscher, Ralf; Koziel, Tomasz

Absolute Structure from Scanning Electron Microscopy

SCIENTIFIC REPORTS

IF3.9

2020-03-04

OAAI

Burkhardt, Ulrich; Borrmann, Horst; Moll, Philip; Schmidt, Marcus; Grin, Yuri; Winkelmann, Aimo

Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging

INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS

IF4.6

2020-02-01

OAAI

Jablon, B. M.; Mingard, K.; Winkelmann, A.; Naresh-Kumar, G.; Hourahine, B.; Trager-Cowan, C.

Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

PHOTONICS RESEARCH

IF7.2

2019-10-30

OAAI

Trager-Cowan, C.; Alasmari, A.; Avis, W.; Bruckbauer, J.; Edwards, P. R.; Hourahine, B.; Kraeusel, S.; Kusch, G.; Johnston, R.; Naresh-Kumar, G.; Martin, R. W.; Nouf-Allehiani, M.; Pascal, E.; Spasevski, L.; Thomson, D.; Vespucci, S.; Parbrook, P. J.; Smith, M. D.; Enslin, J.; Mehnke, F.; Kneissl, M.; Kuhn, C.; Wernicke, T.; Hagedorn, S.; Knauer, A.; Kueller, V.; Walde, S.; Weyers, M.; Coulon, P. -M.; Shields, P. A.; Zhang, Y.; Jiu, L.; Gong, Y.; Smith, R. M.; Wang, T.; Winkelmann, A.

Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope 扫描电镜下GaN纳米线极性的确定及其对光发射的影响

NANO LETTERS

IF9.1

2019-04-30

OAAI

Naresh-Kumar, G.; Bruckbauer, J.; Winkelmann, A.; Yu, X.; Hourahine, B.; Edwards, P. R.; Wang, T.; Trager-Cowan, C.; Martin, R. W.

研究方向