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Leonardo De Chiffre

technical university of denmark

37H指数
276论文数
6.0K被引数
收录论文 42
发表时间
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Use of Miniature Step Gauges to Assess the Performance of 3D Optical Scanners and to Evaluate the Accuracy of a Novel Additive Manufacture Process
errSENSORS
IF3.5
err2020-01-29
err15
errOAAI
errGuerra, Maria Grazia; De Chiffre, Leonardo; Lavecchia, Fulvio; Galantucci, Luigi Maria
err分享
err收藏
Deterministic polishing of micro geometries微观几何形状的确定性抛光
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2020-01-01
err6
PREAI
errBen Achour, Soufian; Bissacco, Giuliano; Beaucamp, Anthony; De Chiffre, Leonardo
err分享
err收藏
Dimensional artefacts to achieve metrological traceability in advanced manufacturing
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2020-01-01
err61
errOAAI
errCarmignato, S.; De Chiffre, L.; Bosse, H.; Leach, R. K.; Balsamo, A.; Estler, W. T.
err分享
err收藏
Development and metrological validation of a new automated scanner system for freeform measurements on wind turbine blades in the production
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2019-03-01
err7
errOAAI
errLyngby, Rasmus Ahrenkiel; Nielsen, Ewa; De Chiffre, Leonardo; Aanaes, Henrik; Dahl, Anders Bjorholm
err分享
err收藏
Predicting the reference length of polymer parts with micrometer uncertainty measured under non-reference conditions
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2018-10-01
err0
PREAI
errMohammadi, A.; Sonne, M. R.; Costa, G. Dalla; Gonzalez-Madruga, D.; De Chiffre, L.; Hattel, J. H.
err分享
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Inline temperature compensation for dimensional metrology of polymer parts in a production environment based on 3D thermomechanical analysis
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2018-07-01
err2
PREAI
errSonne, M. R.; Gonzalez, D.; Dalla Costa, G.; De Chiffre, L.; Mohammadi, A.; Hattel, J. H.
err分享
err收藏
Interlaboratory comparison of a physical and a virtual assembly measured by CT通过CT测量的物理和虚拟装配的实验室间比较
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2018-01-01
err12
errOAAI
errStolfi, A.; De Chiffre, L.
err分享
err收藏
Environmentally clean micromilling of electron beam melted Ti6Al4V
errJOURNAL OF CLEANER PRODUCTION
IF10
err2016-10-01
err23
errOAAI
errBruschi, S.; Tristo, G.; Rysava, Z.; Bariani, P. P.; Umbrello, D.; De Chiffre, L.
err分享
err收藏
3D artefact for concurrent scale calibration in Computed Tomography
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2016-01-01
err11
PREAI
errStolfi, A.; De Chiffre, L.
err分享
err收藏
Economic benefits of metrology in manufacturing
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2016-01-01
err41
PREAI
errSavio, E.; De Chiffre, L.; Carmignato, S.; Meinertz, J.
err分享
err收藏
Acoustic emission-based in-process monitoring of surface generation in robot-assisted polishing
errINTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING
IF4
err2015-04-23
err7
PREAI
errPilny, Lukas; Bissacco, Giuliano; De Chiffre, Leonardo; Ramsing, Jes
err分享
err收藏
A reciprocating pin-on-plate test-rig for studying friction materials for holding brakes
errWEAR
IF6.1
err2014-03-01
err9
errOAAI
errPoulios, K.; Drago, N.; Klit, P.; De Chiffre, L.
err分享
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Benefit quantification of interoperability in coordinate metrology
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2014-01-01
err3
PREAI
errSavio, E.; Carmignato, S.; De Chiffre, L.
err分享
err收藏
Industrial applications of computed tomography计算机断层扫描的工业应用
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2014-01-01
err461
PREAI
errDe Chiffre, L.; Carmignato, S.; Kruth, J. -P.; Schmitt, R.; Weckenmann, A.
err分享
err收藏
A plateau-valley separation method for textured surfaces with a deterministic pattern
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2014-01-01
err16
PREAI
errGodi, Alessandro; Kuhle, Anders; De Chiffre, Leonardo
err分享
err收藏
Comparison on Computed Tomography using industrial items
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2014-01-01
err26
PREAI
errAngel, J.; De Chiffre, L.
err分享
err收藏
Computed tomography for dimensional metrology用于尺寸计量的计算机断层扫描
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2011-01-01
err504
PREAI
errKruth, J. P.; Bartscher, M.; Carmignato, S.; Schmitt, R.; De Chiffre, L.; Weckenmann, A.
err分享
err收藏
Multiple height calibration artefact for 3D microscopy
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2011-01-01
err9
PREAI
errDe Chiffre, L.; Carli, L.; Eriksen, R. S.
err分享
err收藏
Uncertainty analysis of point-by-point sampling complex surfaces using touch probe CMMs DOE for complex surfaces verification with CMM
errPRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF3.7
err2010-01-01
err35
PREAI
errBarini, Emanuele Modesto; Tosello, Guido; De Chiffre, Leonardo
err分享
err收藏
Effectiveness and resolution of tests for evaluating the performance of cutting-fluids in machining aerospace alloys
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2008-01-01
err20
PREAI
errAxinte, D. A.; De Chiffre, L.
err分享
err收藏

研究方向

暂无研究方向
合作学者
合作期刊
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Jean‐Pierre Kruth
H 指数: 89 · 论文数: 582
D
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H 指数: 66 · 论文数: 325
R
Richard Leach
H 指数: 52 · 论文数: 539
J
Jesper Henri Hattel
H 指数: 49 · 论文数: 464
S
Stefania Bruschi
H 指数: 46 · 论文数: 343
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