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Chamard, V.

aix-marseille universite

0H指数
4论文数
0被引数
收录论文 4
发表时间
Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography
err2015-05-18
err42
errOAAI
errChamard, V.; Allain, M.; Godard, P.; Talneau, A.; Patriarche, G.; Burghammer, M.
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X-ray lensless microscopy from undersampled diffraction intensities
err2013-10-01
err18
errOAAI
errBerenguer, F.; Godard, P.; Allain, M.; Belloir, J. -M.; Talneau, A.; Ravy, S.; Chamard, V.
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Three-dimensional high-resolution quantitative microscopy of extended crystals扩展晶体的三维高分辨率定量显微镜
err2011-11-29
err128
errOAAI
errGodard, P.; Carbone, G.; Allain, M.; Mastropietro, F.; Chen, G.; Capello, L.; Diaz, A.; Metzger, T. H.; Stangl, J.; Chamard, V.
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