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J

José Humberto Dias da Silva

Universidade Estadual Paulista
H指数:19
被引数:1,215

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Defect-induced Nb2O5 thin films via O2 flow interruption during RF magnetron sputtering: Tunable photoinduced charge transport

通过射频磁控溅射过程中O2气流中断制备的缺陷诱导Nb2O5薄膜:可调控的光诱导电荷传输

2026-05-120
OAAI
Amino Silane High Positive Charge Layers: A Stable and Durable Alternative Based on Electrostatic Interactions for Titanium Applications; Combining Antimicrobial and Biological Properties

氨基硅烷高正电荷层:一种基于静电相互作用适用于钛应用的稳定且耐用的替代方案;结合抗菌和生物特性

2025-09-230
OAAI