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K

Kevin R. Coffey

State University System of Florida

37H指数
164论文数
4.9K被引数
收录论文 29
发表时间
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Wafer-scale development, characterization, and high temperature stabilization of epitaxial Cr2O3 films grown on Ru(0001)
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2024-04-09
err0
errOAAI
errCumston, Quintin; Patrick, Matthew; Hegazy, Ahmed R.; Zangiabadi, Amirali; Daughtry, Maximillian; Coffey, Kevin R.; Barmak, Katayun; Kaden, William E.
err分享
err收藏
Experimental and Computational Study of the Orientation Dependence of Single-Crystal Ruthenium Nanowire Stability
errNANO LETTERS
IF9.1
err2022-12-13
err2
PREAI
errL'Etoile, Maxwell A.; Wang, Baoming; Cumston, Quintin; Warren, Andrew P.; Ginn, James C.; Barmak, Katayun; Coffey, Kevin R.; Carter, W. Craig; V. Thompson, Carl
err分享
err收藏
Electrodeposition of Ru onto Ru and Au Seed Layers from Solutions of Ruthenium Nitrosyl Sulfate and Ruthenium Chloride
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2021-05-20
err5
errOAAI
errGusley, Ryan; Cumston, Quintin; Coffey, Kevin R.; West, Alan C.; Barmak, Katayun
err分享
err收藏
Influence of the Seed Layer and Electrolyte on the Epitaxial Electrodeposition of Co(0001) for the Fabrication of Single Crystal Interconnects
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2020-12-02
err10
errOAAI
errGusley, Ryan; Ezzat, Sameer; Coffey, Kevin R.; West, Alan C.; Barmak, Katayun
err分享
err收藏
Electrodeposition of Epitaxial Co on Ru(0001)/Al2O3(0001)
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2019-11-14
err11
errOAAI
errGusley, Ryan; Sentosun, Kadir; Ezzat, Sameer; Coffey, Kevin R.; West, Alan C.; Barmak, Katayun
err分享
err收藏
Strain-Driven and Layer-Number-Dependent Crossover of Growth Mode in van der Waals Heterostructures: 2D/2D Layer-By-Layer Horizontal Epitaxy to 2D/3D Vertical Reorientation范德华异质结构中生长模式的应变驱动和层数依赖性交叉: 2D/2D逐层水平外延到2D/3D垂直重新取向
errADVANCED MATERIALS INTERFACES
IF4.4
err2018-05-17
err36
errOAAI
errChoudhary, Nitin; Chung, Hee-Suk; Kim, Jung Han; Noh, Chanwoo; Islam, Md Ashraful; Oh, Kyu Hwan; Coffey, Kevin; Jung, YounJoon; Jung, Yeonwoong
err分享
err收藏
The grain boundary character distribution of highly twinned nanocrystalline thin film aluminum compared to bulk microcrystalline aluminum
errJOURNAL OF MATERIALS SCIENCE
IF3.9
err2017-04-24
err22
PREAI
errRohrer, Gregory S.; Liu, Xuan; Liu, Jiaxing; Darbal, Amith; Kelly, Madeleine N.; Chen, Xiwen; Berkson, Michael A.; Nuhfer, Noel T.; Coffey, Kevin R.; Barmak, Katayun
err分享
err收藏
Enhanced Photoelectrocatalytic Reduction of Oxygen Using Au@TiO2 Plasmonic Film
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2016-12-15
err55
PREAI
errGuo, Limin; Liang, Kun; Marcus, Kyle; Li, Zhao; Zhou, Le; Mani, Prabhu Doss; Chen, Hao; Shen, Chen; Dong, Yajie; Zhai, Lei; Coffey, Kevin R.; Orlovskaya, Nina; Sohn, Yong-Ho; Yang, Yang
err分享
err收藏
Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films偏置溅射的锂磷氧氮化物薄膜的离子电导率
errSOLID STATE IONICS
IF3.3
err2016-04-01
err33
errOAAI
errMani, Prabhu Doss; Saraf, Shashank; Singh, Virendra; Real-Robert, Maria; Vijayakumar, Arun; Duranceau, Steven J.; Seal, Sudipta; Coffey, Kevin R.
err分享
err收藏
Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film
errACTA MATERIALIA
IF9.3
err2014-10-01
err16
PREAI
errLiu, Xuan; Warren, Andrew P.; Nuhfer, Noel T.; Rollett, Anthony D.; Coffey, Kevin R.; Barmak, Katayun
err分享
err收藏
Crystallographic anisotropy of the resistivity size effect in single crystal tungsten nanowires
errSCIENTIFIC REPORTS
IF3.9
err2013-09-05
err38
errOAAI
errChoi, Dooho; Moneck, Matthew; Liu, Xuan; Oh, Soong Ju; Kagan, Cherie R.; Coffey, Kevin R.; Barmak, Katayun
err分享
err收藏
Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear
errPROGRESS IN MATERIALS SCIENCE
IF40
err2013-08-01
err103
PREAI
errBarmak, K.; Eggeling, E.; Kinderlehrer, D.; Sharp, R.; Ta'asan, S.; Rollett, A. D.; Coffey, K. R.
err分享
err收藏
Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films
errPHYSICAL REVIEW B
IF3.7
err2012-07-23
err94
PREAI
errChoi, Dooho; Kim, Chang Soo; Naveh, Doron; Chung, Suk; Warren, Andrew P.; Nuhfer, Noel T.; Toney, Michael F.; Coffey, Kevin R.; Barmak, Katayun
err分享
err收藏
Evolution of nanoscale roughness in Cu/SiO2 and Cu/Ta interfaces
errAPPLIED PHYSICS LETTERS
IF3.6
err2012-01-12
err9
errOAAI
errWarren, Andrew P.; Sun, Tik; Yao, Bo; Barmak, Katayun; Toney, Michael F.; Coffey, Kevin R.
err分享
err收藏
Optical characterization of BCN films deposited at various N2/Ar gas flow ratios by RF magnetron sputtering
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2011-07-01
err15
PREAI
errTodi, Vinit O.; Shantheyanda, Bojanna P.; Todi, Ravi M.; Sundaram, Kalpathy B.; Coffey, Kevin
err分享
err收藏
Strong Coupling between Nanoscale Metamaterials and Phonons纳米超材料与声子之间的强耦合
errNANO LETTERS
IF9.1
err2011-05-11
err127
PREAI
errShelton, D. J.; Brener, I.; Ginn, J. C.; Sinclair, M. B.; Peters, D. W.; Coffey, K. R.; Boreman, G. D.
err分享
err收藏
Determination of optimum Si excess concentration in Er-doped Si-rich SiO2 for optical amplification at 1.54 μm
errAPPLIED PHYSICS LETTERS
IF3.6
err2010-11-18
err7
PREAI
errSavchyn, Oleksandr; Coffey, Kevin R.; Kik, Pieter G.
err分享
err收藏
High-temperature optical properties of sensitized Er3+ in Si-rich SiO2 - implications for gain performance
errOPTICAL MATERIALS
IF4.2
err2010-07-01
err4
PREAI
errSavchyn, Oleksandr; Todi, Ravi M.; Coffey, Kevin R.; Kik, Pieter G.
err分享
err收藏
Surface and grain-boundary scattering in nanometric Cu films
errPHYSICAL REVIEW B
IF3.7
err2010-04-28
err224
PREAI
errSun, Tik; Yao, Bo; Warren, Andrew P.; Barmak, Katayun; Toney, Michael F.; Peale, Robert E.; Coffey, Kevin R.
err分享
err收藏
Experimental demonstration of tunable phase in a thermochromic infrared-reflectarray metamaterial
errOPTICS EXPRESS
IF3.3
err2010-01-12
err35
errOAAI
errShelton, D. J.; Coffey, K. R.; Boreman, G. D.
err分享
err收藏

研究方向

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合作学者
合作期刊
M
Michael F. Toney
H 指数: 140 · 论文数: 1.0K
S
Sudipta Seal
H 指数: 102 · 论文数: 669
B
Beatriz Roldán Cuenya
H 指数: 93 · 论文数: 410
C
Carl V. Thompson
H 指数: 81 · 论文数: 510
L
Luis K. Ono
H 指数: 81 · 论文数: 209
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