Dong‐Hee Lee - Publications, H-index & Citations

Dong‐Hee Lee

sungkyunkwan university (skku)

23H指数

234论文数

2.3K被引数

收录论文 27

发表时间

Volume-adjusted prioritization of suspected equipment by forecasting latent defect risk in uninspected wafers under sparse and irregular semiconductor defect monitoring 在半导体缺陷监测稀疏和不规则条件下，基于未检测晶圆潜在缺陷风险预测的疑似设备体积调整优先级排序

Computers & Industrial Engineering

IF6.5

2026-08-05

PREAI

Kyu-Hoon Kim; Dong-Hee Lee

Data-Driven Methods for Multiple and Dual Response Optimization on Operational Data Using Stochastic PRIM 基于运营数据，利用随机PRIM进行多响应和双响应优化的数据驱动方法

Quality and Reliability Engineering International

IF2.8

2026-07-01

PREAI

Koo, Dong-Hyun; Lee, Dong-Hee; Ouyang, Linhan

Managing Cost-Stability Trade-Offs in Industrial Object Detection: A Unified Decision Support Framework 管理工业目标检测中的成本-稳定性权衡：一个统一的决策支持框架

Algorithms

IF2.1

2026-05-19

PREAI

Lee, Kuhyun; Hong, Jihoon; Kim, Beom-Seok; Song, Yuna; Lee, Dong-Hee

Rule-Based neural surrogate for real-time FEM prediction in H-Beam manufacturing 基于规则的神经代理模型用于H型钢制造中的实时FEM预测

Journal of Intelligent Manufacturing

IF7.4

2026-03-24

OAAI

Hyun-Deok Jang; Seok-Kyu Pyo; Dong-Hee Lee; Sang-Jin Lee; Hyeon-Seok Jeong; Jeong-Eun Lee

Improving quality and reliability of disposable desiccant to prevent condensation in automotive headlamps 提高一次性干燥剂的质量和可靠性，以防止汽车前照灯中出现冷凝现象

Engineering Failure Analysis

IF5.7

2025-06-23

PREAI

Jinhyun Kim; Yongwoo Park; Seonghoon Lee; Minjin Choi; Jaemyeong Lee; Minjae Sung; Seungpil Park; Seokho Jeong; Eunbi Kwon; Donghee Lee

A framework for detecting unknown defect patterns on wafer bin maps using active learning 使用主动学习检测晶圆bin图上未知缺陷模式的框架

EXPERT SYSTEMS WITH APPLICATIONS

IF7.5

2025-01-01

PREAI

Shin, Jin-Su; Kim, Min-Joo; Lee, Dong-Hee

Enhanced detection of unknown defect patterns on wafer bin maps based on an open-set recognition approach 基于开集识别方法的晶圆仓图上未知缺陷模式的增强检测

COMPUTERS IN INDUSTRY

IF9.1

2025-01-01

PREAI

Shin, Jin-Su; Kim, Min-Joo; Kim, Beom-Seok; Lee, Dong-Hee

COMPUTERS & INDUSTRIAL ENGINEERING

IF6.5

2024-10-01

PREAI

Kang, Min-Su; Shin, Jin-Su; Lee, Dong-Hee

Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map 开发基于空间维度的分类法，用于对晶圆仓图中的缺陷模式进行分类

ADVANCED ENGINEERING INFORMATICS

IF9.9

2024-04-01

PREAI

Choi, Seung-Hyun; Lee, Dong-Hee; Kim, Eun-Su; Bae, Young-Mok; Oh, Young-Chan; Kim, Kwang-Jae

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods 使用Bin2Vec和聚类方法开发用于分类晶圆bin图上缺陷模式的分类法

COMPUTERS IN INDUSTRY

IF9.1

2023-11-01

PREAI

Lee, Dong-Hee; Kim, Eun-Su; Choi, Seung-Hyun; Bae, Young-Mok; Park, Jong-Bum; Oh, Young-Chan; Kim, Kwang-Jae

Biocompatible memristive device based on an agarose@gold nanoparticle-nanocomposite layer obtained from nature for neuromorphic computing

SCIENTIFIC REPORTS

IF3.9

2023-04-20

OAAI

Kim, Youngjin; An, Jun Seop; Lee, Donghee; Ryu, Seong Yeon; Hwang, Yoon-Chul; Kim, Dae Hun; Kim, Tae Whan

EWMA-PRIM: Process optimization based on time-series process operational data using the exponentially weighted moving average and patient rule induction method

EXPERT SYSTEMS WITH APPLICATIONS

IF7.5

2022-06-01

PREAI

Kim, So-Hee; Lee, Dong-Hee; Kim, Kwang-Jae

Real-time anomaly detection using convolutional neural network in wire arc additive manufacturing: Molybdenum material 基于卷积神经网络的电弧增材制造实时异常检测: 钼材料

JOURNAL OF MATERIALS PROCESSING TECHNOLOGY

IF7.5

2022-04-01

PREAI

Cho, Hae-Won; Shin, Seung-Jun; Seo, Gi-Jeong; Kim, Duck Bong; Lee, Dong-Hee

An oversampling method for wafer map defect pattern classification considering small and imbalanced data 考虑小数据和不平衡数据的晶片图缺陷模式分类的过采样方法

COMPUTERS & INDUSTRIAL ENGINEERING

IF6.5

2021-12-01

PREAI

Kim, Eun-Su; Choi, Seung-Hyun; Lee, Dong-Hee; Kim, Kwang-Jae; Bae, Young-Mok; Oh, Young-Chan

Approach to derive golden paths under time-varying machine performance in multistage manufacturing process

JOURNAL OF MANUFACTURING SYSTEMS

IF14.2

2021-10-01

PREAI

Lee, Chang-Ho; Lee, Dong-Hee; Choi, Seung-Hyun; Kim, Kwang-Jae

A Robust Interactive Desirability Function Approach for Multiple Response Optimization Considering Model Uncertainty 考虑模型不确定性的多响应优化的鲁棒交互式期望函数方法

IEEE TRANSACTIONS ON RELIABILITY

IF5.7

2021-03-01

PREAI

He, Yingdong; He, Zhen; Kim, Kwang-Jae; Jeong, In-Jun; Lee, Dong-Hee

Ensemble deep learning based semi-supervised soft sensor modeling method and its application on quality prediction for coal preparation process

ADVANCED ENGINEERING INFORMATICS

IF9.9

2020-10-01

PREAI

Yin, Xianhui; Niu, Zhanwen; He, Zhen; Li, Zhaojun(Steven); Lee, Dong-hee

An integrated computational intelligence technique based operating parameters optimization scheme for quality improvement oriented process-manufacturing system

COMPUTERS & INDUSTRIAL ENGINEERING

IF6.5

2020-02-01

PREAI

Yin, Xianhui; Niu, Zhanwen; He, Zhen; Li, Zhaojun(Steven); Lee, Donghee

A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives

JOURNAL OF MANUFACTURING SYSTEMS

IF14.2

2019-07-01

PREAI

Lee, Dong-Hee; Lee, Chang-Ho; Choi, Seung-Hyun; Kim, Kwang-Jae

A data-driven approach to selection of critical process steps in the semiconductor manufacturing process considering missing and imbalanced data

JOURNAL OF MANUFACTURING SYSTEMS

IF14.2

2019-07-01

PREAI

Lee, Dong-Hee; Yang, Jin-Kyung; Lee, Cho-Heui; Kim, Kwang-Jae

研究方向