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Alexander Efremov

nrc “kurchatov institute” – valiev ipt

26H指数
198论文数
2.4K被引数
收录论文 33
发表时间
On relationships between gas-phase and heterogeneous process kinetics in CF4+H2+Ar plasma
errVACUUM
IF3.9
err2025-04-01
err1
PREAI
errMiakonkikh, Andrey; Kuzmenko, Vitaly; Efremov, Alexander; Rudenko, Konstantin
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On mechanisms to control SiO2 etching kinetics in low-power reactive-ion etching process using CF4 + C4F8 + Ar + He plasma
errVACUUM
IF3.9
err2023-10-01
err6
PREAI
errChoi, Gilyoung; Efremov, Alexander; Lee, Dae-Kug; Cho, Choong-Ho; Kwon, Kwang-Ho
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On Relationships between Plasma Chemistry and Surface Reaction Kinetics Providing the Etching of Silicon in CF4, CHF3, and C4F8 Gases Mixed with Oxygen
err2023-07-17
err7
errOAAI
errBaek, Seung Yong; Efremov, Alexander; Bobylev, Alexander; Choi, Gilyoung; Kwon, Kwang-Ho
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On mechanisms influencing etching/polymerization balance in multi-component fluorocarbon gas mixtures
errVACUUM
IF3.9
err2022-12-01
err10
PREAI
errEfremov, Alexander; Son, Hye Jun; Choi, Gilyoung; Kwon, Kwang-Ho
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A comparison of CF4, CBrF3 and C2Br2F4 plasmas: Physical parameters and densities of atomic species
errVACUUM
IF3.9
err2022-06-01
err6
PREAI
errMiakonkikh, Andrey; Kuzmenko, Vitaly; Efremov, Alexander; Rudenko, Konstantin
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Dry Etching Performance and Gas-Phase Parameters of C6F12O + Ar Plasma in Comparison with CF4 + Ar
err2021-03-24
err8
errOAAI
errLim, Nomin; Choi, Yeon Sik; Efremov, Alexander; Kwon, Kwang-Ho
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Plasma Parameters and Etching Characteristics of SiOxNy Films in CF4 + O2 + X (X = C4F8 or CF2Br2) Gas Mixtures
err2020-12-01
err4
errOAAI
errNam, Yunho; Efremov, Alexander; Lee, Byung Jun; Kwon, Kwang-Ho
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Etching Characteristics of Carbon Nanotube Thin Films in O2/Ar Plasma
err2016-11-01
err1
PREAI
errLee, Jaemin; Efremov, Alexander; Lee, Junmyung; Kim, Kwangsoo; Kwon, Kwang-Ho
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Microstrain temperature evolution in β-eucryptite ceramics: Measurement and model
err2012-07-01
err28
PREAI
errBruno, G.; Garlea, V. O.; Muth, J.; Efremov, A. M.; Watkins, T. R.; Shyam, A.
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Connecting the macro and microstrain responses in technical porous ceramics. Part II: microcracking
err2012-01-07
err35
PREAI
errBruno, Giovanni; Efremov, Alexander M.; An, Chong P.; Wheaton, Bryan R.; Hughes, Darren J.
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Etching characteristics and mechanism of Ga-doped ZnO thin films in inductively-coupled HBr/X (X = Ar, He, N2, O2) plasmas
errVACUUM
IF3.9
err2011-04-01
err9
PREAI
errHam, Y. -H.; Efremov, A.; Lee, H. W.; Yun, S. J.; Min, N. K.; Baek, K. -H.; Do, L. -M.; Kwon, K. -H.
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