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Francesco La Via

consiglio nazionale delle ricerche

35H指数
479论文数
5.7K被引数
收录论文 85
发表时间
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Microstructure-Driven Loss Mechanisms and Tensor-Based FEM Calibration微观结构驱动的损耗机制与基于张量的FEM校准
errMicromachines
IF3
err2026-09-15
err0
errOAAI
errAnnamaria Muoio; Angela Garofalo; Francesco La Via
err分享
err收藏
Wide reverse-bias response of a 100-µm 4H-SiC P-i-N detector: UV-TCT probing, α sources and D-T neutrons100-µm 4H-SiC P-i-N探测器的宽反向偏压响应：UV-TCT探针、α源和D-T中子
errMeasurement
IF5.6
err2026-07-14
err0
PREAI
errMancuso, Alfio Samuele; Paz, Ivan Lopez; Kushoro, Matteo Hakeem; De Luca, Saverio; Gallo, Erik; Jimenez, Marcio; Moffat, Neil; Muoio, Annamaria; Pellegrini, Giulio; Perez, Martin; Quadrivi, Eleonora; Sangregorio, Enrico; Trotta, Antonio; Tudisco, Salvatore; Vanellone, Silvia; La Via, Francesco
err分享
err收藏
Heteroepitaxial 3C-SiC for MEMS Applications异质外延3C-SiC用于MEMS应用
errMicromachines
IF3
err2026-04-21
err0
errOAAI
errAngela Garofalo; Annamaria Muoio; Luca Belsito; Sergio Sapienza; Matteo Ferri; Alberto Roncaglia; Francesco La Via
err分享
err收藏
Transient Charge Collection in Ultra-Thin SiC Membranes for Single-Ion Detection超薄SiC膜中的瞬态电荷收集用于单离子检测
errSensors
IF3.5
err2026-03-13
err0
errOAAI
errEnrico Sangregorio; Alfio Samuele Mancuso; Saverio De Luca; Annamaria Muoio; Lucia Calcagno; Francesco La Via
err分享
err收藏
High-Voltage 4H-SiC PiN Diodes: Ion Implantation vs. Epitaxial Growth for Wide-Temperature Operation高压4H-SiC PiN二极管：离子注入与外延生长用于宽温工作
errMaterials
IF3.2
err2026-02-27
err0
errOAAI
errAlfio Samuele Mancuso; Saverio De Luca; Enrico Sangregorio; Annamaria Muoio; Erik Gallo; Silvia Vanellone; Eleonora Quadrivi; Antonio Trotta; Lucia Calcagno; Salvo Tudisco; Francesco La Via
err分享
err收藏
Fast neutron spectroscopy with 4H-SiC solid-state detectors up to 500 °C for nuclear fusion applications基于4H-SiC固态探测器的快中子能谱学及其在核聚变应用中的温度性能（最高可达500 °C）
errMeasurement Science and Technology
IF3.4
err2025-12-09
err0
errOAAI
errMatteo Hakeem Kushoro; Gabriele Croci; Eleonora Quadrivi; Silvia Vanellone; Maurizio Angelone; Giuseppe Gorini; Francesco La Via; Francesco Laviano; Stefano Loreti; Alfio Samuele Mancuso; Massimo Nocente; Guglielmo Pagano; Enrico Perelli Cippo; Antonino Pietropaolo; Mario Pillon; Oscar Putignano; Marica Rebai; Marco Tardocchi; Daniele Torsello; Erik Gallo
err分享
err收藏
SiC membranes for real-time X-ray beam monitoring in synchrotron beamlinesSiC膜在同步加速器光束线中用于实时X射线束监测
errJOURNAL OF INSTRUMENTATION
IF1.3
err2025-12-01
err0
PREAI
errTrovato, G.; De Napoli, M.; Gollwitzer, C.; Finizio, S.; Krumrey, M.; La Via, F.; Lanzano, L.; Milluzzo, G.; Moscato, S.; Mueller, M.; Romano, F.; Ferreira Sanchez, D.; Camarda, M.
err分享
err收藏
Numerical Simulations of 3C-SiC High-Sensitivity Strain Meters3C-SiC高灵敏度应变计的数值模拟
errMicromachines 2025, Vol. 16, Page 989
IF3
err2025-08-29
err0
errOAAI
errAnnamaria Muoio; Angela Garofalo; Sergio Sapienza; Francesco La Via
err分享
err收藏
Model of Quality Factor for (111) 3C-SiC Double-Clamped Beams
errMICROMACHINES
IF3
err2025-01-28
err0
errOAAI
errGarofalo, Angela; Muoio, Annamaria; Sapienza, Sergio; Ferri, Matteo; Belsito, Luca; Roncaglia, Alberto; La Via, Francesco
err分享
err收藏
Exploring crystal recovery and dopant activation in coated laser annealing on ion implanted 4H-SiC epitaxial layers在离子注入的4H-SiC外延层上的涂层激光退火中探索晶体恢复和掺杂剂激活
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2024-05-01
err0
PREAI
errCalabretta, C.; Pecora, A.; Agati, M.; Muoio, A.; Scuderi, V.; Privitera, S.; Reitano, R.; Boninelli, S.; La Via, F.
err分享
err收藏
Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices
errMATERIALS
IF3.2
err2023-08-15
err3
errOAAI
errSchiliro, Emanuela; Fiorenza, Patrick; Lo Nigro, Raffaella; Galizia, Bruno; Greco, Giuseppe; Di Franco, Salvatore; Bongiorno, Corrado; La Via, Francesco; Giannazzo, Filippo; Roccaforte, Fabrizio
err分享
err收藏
Space charge limited current in 4H-SiC Schottky diodes in the presence of stacking faults
errAPPLIED PHYSICS LETTERS
IF3.6
err2023-08-14
err7
PREAI
errVivona, M.; Fiorenza, P.; Scuderi, V.; La Via, F.; Giannazzo, F.; Roccaforte, F.
err分享
err收藏
Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors重离子在硅和碳化硅探测器中的辐射损伤
errSENSORS
IF3.5
err2023-07-19
err9
errOAAI
errAltana, Carmen; Calcagno, Lucia; Ciampi, Caterina; La Via, Francesco; Lanzalone, Gaetano; Muoio, Annamaria; Pasquali, Gabriele; Pellegrino, Domenico; Puglia, Sebastiana; Rapisarda, Giuseppe; Tudisco, Salvatore
err分享
err收藏
Emerging SiC Applications beyond Power Electronic Devices
errMICROMACHINES
IF3
err2023-06-06
err33
errOAAI
errLa Via, Francesco; Alquier, Daniel; Giannazzo, Filippo; Kimoto, Tsunenobu; Neudeck, Philip; Ou, Haiyan; Roncaglia, Alberto; Saddow, Stephen E. E.; Tudisco, Salvatore
err分享
err收藏
Impact of Doping on Cross-Sectional Stress Assessment of 3C-SiC/Si Heteroepitaxy
errMATERIALS
IF3.2
err2023-05-18
err2
errOAAI
errScuderi, Viviana; Zielinski, Marcin; La Via, Francesco
err分享
err收藏
Laser crystallization of amorphous TiO2 on polymer
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2023-04-01
err0
errOAAI
errZimbone, Massimo; Cantarella, Maria; Giuffrida, Federico; La Via, Francesco; Privitera, Vittorio; Napolitani, Enrico; Impellizzeri, Giuliana
err分享
err收藏
In situ bow reduction during sublimation growth of cubic silicon carbide
errREVIEWS ON ADVANCED MATERIALS SCIENCE
IF3.9
err2022-12-15
err1
errOAAI
errKollmuss, Manuel; Mauceri, Marco; Roder, Melissa; La Via, Francesco; Wellmann, Peter J.
err分享
err收藏
Towards vertical Schottky diodes on bulk cubic silicon carbide (3C-SiC)
errAPPLIED SURFACE SCIENCE
IF6.9
err2022-12-01
err10
PREAI
errRoccaforte, F.; Greco, G.; Fiorenza, P.; Di Franco, S.; Giannazzo, F.; La Via, F.; Zielinski, M.; Mank, H.; Jokubavicius, V.; Yakimova, R.
err分享
err收藏
Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications
errMICROMACHINES
IF3
err2022-06-30
err8
errOAAI
errMeli, Alessandro; Muoio, Annamaria; Reitano, Riccardo; Sangregorio, Enrico; Calcagno, Lucia; Trotta, Antonio; Parisi, Miriam; Meda, Laura; La Via, Francesco
err分享
err收藏
Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC
errCRYSTAL GROWTH & DESIGN
IF3.4
err2022-06-29
err9
errOAAI
errCalabretta, Cristiano; Scuderi, Viviana; Bongiorno, Corrado; Cannizzaro, Annalisa; Anzalone, Ruggero; Calcagno, Lucia; Mauceri, Marco; Crippa, Danilo; Boninelli, Simona; La Via, Francesco
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研究方向

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合作学者
合作期刊
I
I. López Paz
H 指数: 118 · 论文数: 1.4K
A
A. Santangelo
H 指数: 81 · 论文数: 1.1K
F
F. Romanò
H 指数: 74 · 论文数: 670
T
Tsunenobu Kimoto
H 指数: 72 · 论文数: 1.0K
E
Elza Bontempi
H 指数: 59 · 论文数: 435
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