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Poul‐Erik Hansen

danish fundamental metrology a/s

14H指数
108论文数
925被引数
收录论文 15
发表时间
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Corrigendum to “Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology” [Journal of Computational Physics, 521 (2025), 1-21/113519]勘误：“Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology” [Journal of Computational Physics, 521 (2025), 1-21/113519]
errJournal of Computational Physics
IF3.8
err2025-10-31
err0
errOAAI
errHelia Hooshmand; Tobias Pahl; Poul-Erik Hansen; Liwei Fu; Alexander Birk; Mirza Karamehmedovic; Peter Lehmann; Stephan Reichelt; Richard Leach; Samanta Piano
err分享
err收藏
Digital Twins for 3D Confocal Microscopy: Near-Field, Far-Field, and Comparison with Experiments
errSENSORS
IF3.5
err2025-03-22
err0
errOAAI
errHansen, Poul-Erik; Pahl, Tobias; Fu, Liwei; Nielsen, Ida; Rosenthal, Felix; Reichelt, Stephan; Lehmann, Peter; Romer, Astrid Tranum
err分享
err收藏
Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures低温下硅纳米线阵列的深反应离子刻蚀
errAPPLIED PHYSICS REVIEWS
IF11.6
err2024-04-17
err5
errOAAI
errXu, Jiushuai; Refino, Andam Deatama; Delvallee, Alexandra; Seibert, Sebastian; Schwalb, Christian; Hansen, Poul Erik; Foldyna, Martin; Siaudinyte, Lauryna; Hamdana, Gerry; Wasisto, Hutomo Suryo; Kottmeier, Jonathan; Dietzel, Andreas; Weimann, Thomas; Pruessing, Jan Kristen; Bracht, Hartmut; Peiner, Erwin
err分享
err收藏
Steerable photonic jet for super- resolution microscopy
errOPTICS EXPRESS
IF3.3
err2022-10-28
err6
errOAAI
errKaramehmedovic, Mirza; Scheel, Kenneth; Pedersen, Frederik Listov-Saabye; Villegas, Arturo; Hansen, Poul-Erik
err分享
err收藏
In-line characterization of nanostructures produced by roll-to-roll nanoimprinting
errOPTICS EXPRESS
IF3.3
err2021-01-25
err3
errOAAI
errMadsen, Jonas Skovlund; Geisler, Mathias; Lotz, Mikkel Berri; Zalkovskij, Maksim; Bilenberg, Brian; Korhonen, Raimo; Peltonen, Petri; Hansen, Poul Erik; Jensen, Soren Alkaersig
err分享
err收藏
Replacing libraries in scatterometry
errOPTICS EXPRESS
IF3.3
err2018-12-20
err10
errOAAI
errMadsen, Jonas Skovlund Moller; Jensen, Soren Alkaersig; Nygard, Jesper; Hansen, Poul Erik
err分享
err收藏
Traceable Mueller polarimetry and scatterometry for shape reconstruction of grating structures
errAPPLIED SURFACE SCIENCE
IF6.9
err2017-11-01
err7
PREAI
errHansen, Poul-Erik; Madsen, Morten H.; Lehtolahti, Joonas; Nielsen, Lars
err分享
err收藏
Plasmonic color metasurfaces fabricated by a high speed roll-to-roll method
errNANOSCALE
IF5.1
err2017-01-01
err40
errOAAI
errMurthy, Swathi; Pranov, Henrik; Feidenhans'l, Nikolaj A.; Madsen, Jonas S.; Hansen, Poul Erik; Pedersen, Henrik C.; Taboryski, Rafael
err分享
err收藏
Imaging scatterometry for flexible measurements of patterned areas
errOPTICS EXPRESS
IF3.3
err2016-01-13
err27
errOAAI
errMadsen, Morten Hannibal; Hansen, Poul-Erik
err分享
err收藏
Fast characterization of moving samples with nano-textured surfaces
errOPTICA
IF8.5
err2015-03-30
err24
errOAAI
errMadsen, Morten Hannibal; Hansen, Poul-Erik; Zalkovskij, Maksim; Karamehmedovic, Mirza; Garnaes, Jorgen
err分享
err收藏
Profile estimation for Pt submicron wire on rough Si substrate from experimental data
errOPTICS EXPRESS
IF3.3
err2012-09-06
err10
errOAAI
errKaramehmedovic, Mirza; Hansen, Poul-Erik; Dirscherl, Kai; Karamehmedovic, Emir; Wriedt, Thomas
err分享
err收藏
Cantilever biosensor reader using a common-path, holographic optical interferometer
errAPPLIED PHYSICS LETTERS
IF3.6
err2010-12-03
err4
errOAAI
errPedersen, Henrik C.; Jakobsen, Michael L.; Hanson, Steen G.; Dam-Hansen, Carsten; Olesen, Tom; Hansen, Poul
err分享
err收藏
Influence of annealing and deformation on optical properties of ultra precision diamond turned and anodized 6060 aluminium alloy
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2010-05-01
err11
PREAI
errTabrizian, N.; Hansen, H. N.; Hansen, P. E.; Ambat, R.; Moller, P.
err分享
err收藏
Synchronous Torques in Split-Phase Induction Motors
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2010-01-01
err6
PREAI
errAndersen, Peter Scavenius; Dorrell, David G.; Weihrauch, Niels Christian; Hansen, Poul Erik
err分享
err收藏
Combined optimization and hybrid scalar-vector diffraction method for grating topography parameters determination
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2009-12-01
err12
PREAI
errHansen, P-E; Nielsen, L.
err分享
err收藏

研究方向

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合作学者
合作期刊
J
Jesper Nygård
H 指数: 62 · 论文数: 283
D
David G. Dorrell
H 指数: 60 · 论文数: 448
R
Richard Leach
H 指数: 52 · 论文数: 539
P
Peter Lehmann
H 指数: 46 · 论文数: 324
H
Hans Nørgaard Hansen
H 指数: 44 · 论文数: 538
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