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M

M. Chicoine

universite de montreal

19H指数
95论文数
1.4K被引数
收录论文 18
发表时间
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Urbach tails and optical absorption of amorphous silicon coatingsUrbach尾和非晶硅涂层的吸收光谱
err2025-11-26
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errD Diksha; A Amato; V Spagnuolo; S Roorda; M Chicoine; I W Martin; J Steinlechner
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Optical properties of germania and titania at 1064 nm and at 1550 nm
err2024-05-17
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errDiksha, D.; Amato, A.; Spagnuolo, V; McGhee, G., I; Chicoine, M.; Clark, C.; Hill, S.; Hough, J.; Johnston, R.; Keil, R.; Mavridi, N.; Reid, S.; Rowan, S.; Schapals, T.; Schiettekatte, F.; Tait, S. C.; Martin, I. W.; Steinlechner, J.
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Ar transport and blister growth kinetics in titania-doped germania-based optical coatings
err2024-05-09
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errLalande, Emile; Davenport, Aaron; Marchand, Lory; Markosyan, Ashot; Martinez, Daniel; Paolone, Annalisa; Rezac, Michael; Bazzan, Marco; Chicoine, Martin; Colaux, Julien L.; Coulon, Matthieu; Fejer, Martin M.; Lussier, Alexandre W.; Majorana, Ettore; Martinu, Ludvik; Menoni, Carmen; Michel, Christophe; Ricci, Fulvio; Schiettekatte, Francois; Shcheblanov, Nikita; Smith, Joshua R.; Teillon, Julien; Terwagne, Guy; Vajente, Gabriele
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Unveiling the cation ratio mediated structural modifications in TiO2:GeO2 mixtures for gravitational-wave detectors
err2024-04-22
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PREAI
errBhowmick, Sangita; Osovsky, Ruth; Davenport, Aaron; Schiettekatte, Francois; Chicoine, Martin; Menoni, Carmen S.
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Optical and Mechanical Properties of Ion-Beam-Sputtered MgF2 Thin Films for Gravitational-Wave Interferometers
err2022-03-23
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errGranata, M.; Amato, A.; Bischi, M.; Bazzan, M.; Cagnoli, G.; Canepa, M.; Chicoine, M.; Di Michele, A.; Favaro, G.; Forest, D.; Guidi, G. M.; Maggioni, G.; Martelli, F.; Menotta, M.; Montani, M.; Piergiovanni, F.; Schiettekatte, F.
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Enhanced medium-range order in vapor-deposited germania glasses at elevated temperatures
err2021-09-10
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errYang, Le; Vajente, Gabriele; Fazio, Mariana; Ananyeva, Alena; Billingsley, GariLynn; Markosyan, Ashot; Bassiri, Riccardo; Prasai, Kiran; Fejer, Martin M.; Chicoine, Martin; Schiettekatte, Francois; Menoni, Carmen S.
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Towards semi-insulating InGaAsP/InP layers by post-growth processing using Fe ion implantation and rapid thermal annealing
err2013-04-03
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PREAI
errFekecs, Andre; Chicoine, Martin; Ilahi, Bouraoui; Schiettekatte, Francois; Charette, Paul G.; Ares, Richard
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Silicon nanocrystal synthesis by implantation of natural Si isotopes通过注入天然Si同位素合成硅纳米晶体
err2010-04-01
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PREAI
errBarba, D.; Koshel, D.; Martin, F.; Ross, G. G.; Chicoine, M.; Schiettekatte, F.; Yedji, M.; Demarche, J.; Terwagne, G.
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Thermal evolution of defects produced by implantation of H, D and He in Silicon
err2008-10-01
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PREAI
errSimpson, P. J.; Knights, A. P.; Chicoine, M.; Dudeck, K.; Moutanabbir, O.; Ruffell, S.; Schiettekatte, F.; Terreault, B.
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Microstructural evolution in H ion induced splitting of freestanding GaN
err2008-07-25
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PREAI
errMoutanabbir, O.; Scholz, R.; Senz, S.; Goesele, U.; Chicoine, M.; Schiettekatte, F.; Suesskraut, F.; Krause-Rehberg, R.
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Lifetimes of states in 19Ne above the 15O+α breakup threshold
err2008-03-11
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errMythili, S.; Davids, B.; Alexander, T. K.; Ball, G. C.; Chicoine, M.; Chakrawarthy, R. S.; Churchman, R.; Forster, J. S.; Gujrathi, S.; Hackman, G.; Howell, D.; Kanungo, R.; Leslie, J. R.; Padilla, E.; Pearson, C. J.; Ruiz, C.; Ruprecht, G.; Schumaker, M. A.; Tanihata, I.; Vockenhuber, C.; Walden, P.; Yen, S.
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Damage evolution in low-energy ion implanted silicon
err2007-02-05
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PREAI
errKarmouch, R.; Anahory, Y.; Mercure, J. -F.; Bouilly, D.; Chicoine, M.; Bentoumi, G.; Leonelli, R.; Wang, Y. Q.; Schiettekatte, F.
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Influence of isotopic substitution and He coimplantation on defect complexes and voids induced by H ions in silicon
err2007-02-01
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PREAI
errMoutanabbir, O.; Terreault, B.; Chicoine, M.; Schiettekatte, F.; Simpson, P. J.
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Lifetime of 19Ne*(4.03 MeV)
err2006-10-10
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errKanungo, R.; Alexander, T. K.; Andreyev, A. N.; Ball, G. C.; Chakrawarthy, R. S.; Chicoine, M.; Churchman, R.; Davids, B.; Forster, J. S.; Gujrathi, S.; Hackman, G.; Howell, D.; Leslie, J. R.; Morton, A. C.; Mythili, S.; Pearson, C. J.; Ressler, J. J.; Ruiz, C.; Savajols, H.; Schumaker, M. A.; Tanihata, I.; Walden, P.; Yen, S.
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The effect of size and depth profile of Si-nc imbedded in a SiO2 layer on the photoluminescence spectra
err2005-10-01
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PREAI
errSmirani, R; Martin, F; Abel, G; Wang, YQ; Chicoine, M; Ross, GG
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High-energy x-ray diffraction study of pure amorphous silicon
err1999-11-15
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PREAI
errLaaziri, K; Kycia, S; Roorda, S; Chicoine, M; Robertson, JL; Wang, J; Moss, SC
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