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收藏Comparative evaluation of organic contamination sources from roller and pencil type PVA brushes during the Post-CMP cleaning process
Lee, Jung-Hwan; Poddar, Maneesh Kumar; Han, Kwang-Min; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Kim, Tae-Gon; Wada, Yutaka; Hamada, Satomi; Hiyama, Hirokuni; Park, Jin-Goo
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收藏Nanocatalyst-induced hydroxyl radical (•OH) slurry for tungsten CMP for next-generation semiconductor processing
Poddar, Maneesh Kumar; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Jeong, Yeon-Ah; Lee, Jung-Hwan; Kim, Tae-Gon; Kim, Jae-Hyun; Park, Jong-Dai; Lee, Min-Gun; Park, Chang-Yong; Han, Seong-Jun; Choi, Jae-Gon; Park, Jin-Goo
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收藏Ultrasound-induced break-in method for an incoming polyvinyl acetal (PVA) brush used during post-CMP cleaning processCMP后清洁过程中使用的传入聚乙烯醇缩醛 (PVA) 刷的超声诱导的断裂方法
Lee, Jung-Hwan; Poddar, Maneesh Kumar; Yerriboina, Nagendra Prasad; Ryu, Heon-Yul; Han, Kwang-Min; Kim, Tae-Gon; Hamada, Satomi; Wada, Yutaka; Hiyama, Hirokuni; Park, Jin-Goo
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收藏Study on possible root causes of contamination from an incoming PVA brush during post-CMP cleaning
Lee, Jung-Hwan; Purushothaman, Muthukrishnan; Han, Kwang-Min; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Kim, Tae-Gon; Wada, Yutaka; Hamada, Satomi; Hiyama, Hirokuni; Park, Jin-Goo
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