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Jin-Goo Park

hanyang university erica

28H指数
282论文数
2.8K被引数
收录论文 51
发表时间
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Azoles as corrosion inhibitors in alkaline medium for ruthenium chemical mechanical planarization applications:Electrochemical and theoretical analysis
err2025-01-01
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PREAI
errDhongde, Nikhil Rahul; Das, Nipu Kumar; Hazarika, Jenasree; Park, Jin-Goo; Banerjee, Tamal; Rajaraman, Prasanna Venkatesh
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Effect of ammonium halide salts on wet chemical nanoscale etching and polishing of InGaAs surfaces for advanced CMOS devices
err2023-07-01
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PREAI
errSamanta, Suprakash; Jin, Seungwan; Lee, Chan-Hee; Lee, Seong-Soo; Struyf, Herbert; Kim, Tae-Gon; Park, Jin-Goo
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Effect of slurry particles on PVA brush contamination during post-CMP cleaningCMP后清洁过程中浆料颗粒对PVA刷污染的影响
err2022-11-01
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PREAI
errSahir, Samrina; Cho, Hwi-Won; Jalalzai, Palwasha; Samanta, Suprakash; Hamada, Satomi; Kim, Tae-Gon; Park, Jin-Goo
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Chemically controlled megasonic cleaning of patterned structures using solutions with dissolved gas and surfactant使用具有溶解气体和表面活性剂的溶液对图案化结构进行化学控制的兆声波清洁
err2022-01-01
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errOAAI
errSahoo, Bichitra Nanda; Han, So Young; Kim, Hyun-Tae; Ando, Keita; Kim, Tae-Gon; Kang, Bong-Kyun; Klipp, Andreas; Yerriboina, Nagendra Prasad; Park, Jin-Goo
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Investigation of the effect of different cleaning forces on Ce-O-Si bonding during oxide post-CMP cleaningCMP后氧化物清洗过程中不同清洗力对ce-o-si键合影响的研究
err2021-04-01
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PREAI
errSahir, Samrina; Yerriboina, Nagendra Prasad; Han, So-Young; Han, Kwang-Min; Kim, Tae-Gon; Mahadev, Niraj; Park, Jin-Goo
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Tungsten passivation layer (WO3) formation mechanisms during chemical mechanical planarization in the presence of oxidizers
err2021-01-01
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PREAI
errPoddar, Maneesh Kumar; Jalalzai, Palwasha; Sahir, Samrina; Yerriboina, Nagendra Prasad; Kim, Tae-Gon; Park, Jin-Goo
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Comparative evaluation of organic contamination sources from roller and pencil type PVA brushes during the Post-CMP cleaning process
err2020-10-01
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PREAI
errLee, Jung-Hwan; Poddar, Maneesh Kumar; Han, Kwang-Min; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Kim, Tae-Gon; Wada, Yutaka; Hamada, Satomi; Hiyama, Hirokuni; Park, Jin-Goo
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Nanocatalyst-induced hydroxyl radical (•OH) slurry for tungsten CMP for next-generation semiconductor processing
err2019-12-02
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PREAI
errPoddar, Maneesh Kumar; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Jeong, Yeon-Ah; Lee, Jung-Hwan; Kim, Tae-Gon; Kim, Jae-Hyun; Park, Jong-Dai; Lee, Min-Gun; Park, Chang-Yong; Han, Seong-Jun; Choi, Jae-Gon; Park, Jin-Goo
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Ultrasound-induced break-in method for an incoming polyvinyl acetal (PVA) brush used during post-CMP cleaning processCMP后清洁过程中使用的传入聚乙烯醇缩醛 (PVA) 刷的超声诱导的断裂方法
err2019-09-01
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PREAI
errLee, Jung-Hwan; Poddar, Maneesh Kumar; Yerriboina, Nagendra Prasad; Ryu, Heon-Yul; Han, Kwang-Min; Kim, Tae-Gon; Hamada, Satomi; Wada, Yutaka; Hiyama, Hirokuni; Park, Jin-Goo
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Study on possible root causes of contamination from an incoming PVA brush during post-CMP cleaning
err2019-08-01
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PREAI
errLee, Jung-Hwan; Purushothaman, Muthukrishnan; Han, Kwang-Min; Ryu, Heon-Yul; Yerriboina, Nagendra Prasad; Kim, Tae-Gon; Wada, Yutaka; Hamada, Satomi; Hiyama, Hirokuni; Park, Jin-Goo
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Fabrication of high performance copper-resin lapping plate for sapphire: A combined 2-body and 3-body diamond abrasive wear on sapphire
err2018-04-01
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PREAI
errPyun, Hae-Jung; Purushothaman, Muthukrishnan; Cho, Byoung-Jun; Lee, Jung-Hwan; Park, Jin-Goo
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Fabrication of hydrophobic/hydrophilic switchable aluminum surface using poly(N-isopropylacrylamide)
err2016-10-01
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PREAI
errRyu, Heon-Yul; Yoon, Sung Ho; Han, Dong-Ho; Hafeez, Hassan; Paluvai, Nagarjuna Reddy; Lee, Choon Soo; Park, Jin-Goo
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