T. Yamamoto - Publications, H-index & Citations

T. Yamamoto

Jikei University

19H指数

75论文数

1.4K被引数

收录论文 9

发表时间

Crowd-sourcing materials-science challenges with the NOMAD 2018 Kaggle competition

NPJ COMPUTATIONAL MATERIALS

IF11.9

2019-11-18

OAAI

Sutton, Christopher; Ghiringhelli, Luca M.; Yamamoto, Takenori; Lysogorskiy, Yury; Blumenthal, Lars; Hammerschmidt, Thomas; Golebiowski, Jacek R.; Liu, Xiangyue; Ziletti, Angelo; Scheffler, Matthias

Interaction between RNF8 and DYRK2 is required for the recruitment of DNA repair molecules to DNA double-strand breaks RNF8和DYRK2之间的相互作用是将DNA修复分子募集到DNA双链断裂所必需的

FEBS LETTERS

IF3

2017-03-06

OAAI

Yamamoto, Takenori; Nihira, Naoe Taira; Yogosawa, Satomi; Aoki, Katsuhiko; Takeda, Hiroyuki; Sawasaki, Tatsuya; Yoshida, Kiyotsugu

Screened hybrid density functional study on Nb- and Ta-doped TiO2

PHYSICAL REVIEW B

IF3.7

2012-01-23

PREAI

Yamamoto, Takenori; Ohno, Takahisa

Dielectric constants of amorphous hafnium aluminates: First-principles study

PHYSICAL REVIEW B

IF3.7

2007-05-07

PREAI

Momida, Hiroyoshi; Hamada, Tomoyuki; Takagi, Yoshiteru; Yamamoto, Takenori; Uda, Tsuyoshi; Ohno, Takahisa

Effects of nitrogen atom doping on dielectric constants of Hf-based gate oxides

APPLIED PHYSICS LETTERS

IF3.6

2006-03-14

PREAI

Momida, H; Hamada, T; Yamamoto, T; Uda, T; Umezawa, N; Chikyow, T; Shiraishi, K; Ohno, T

Theoretical study on dielectric response of amorphous alumina

PHYSICAL REVIEW B

IF3.7

2006-02-22

109

PREAI

Momida, H; Hamada, T; Takagi, Y; Yamamoto, T; Uda, T; Ohno, T

Quantification of nitrogen profiles in HfSiON films for gate dielectrics

APPLIED SURFACE SCIENCE

IF6.9

2004-06-01

PREAI

Yamamoto, T; Miyamoto, T; Karen, A

Characterization of Si/GexSi1-x structures by micro-Raman imaging

APPLIED PHYSICS LETTERS

IF3.6

2004-04-05

PREAI

Nakashima, S; Yamamoto, T; Ogura, A; Uejima, K; Yamamoto, T

Characterization of high-k gate dielectric films using SIMS 使用SIMS表征高k栅极介电膜

APPLIED SURFACE SCIENCE

IF6.9

2003-01-01

PREAI

Yamamoto, T; Morita, N; Sugiyama, N; Karen, A; Okuno, K

研究方向