Jean-Marc Belloir - Publications, H-index & Citations

Jean-Marc Belloir

cnes

12H指数

33论文数

396被引数

收录论文 6

发表时间

Infrared Nanocrystals for Space Application: Hardness to Irradiations 空间应用中的红外纳米晶体：抗辐照硬度

Advanced Functional Materials

IF19

2026-02-15

OAAI

Alexandre Neyret; Dario Mastrippolito; Bingbing Xia; Adrien Khalili; Maxime Lebreton; Giorgia Strobbia; Albin Colle; Marco Paye; Mariarosa Cavallo; Erwan Bossavit; Claire Abadie; Yoann Prado; Debora Pierucci; Victor Parahyba; Francois Coursaget; David Darson; Emrick Briand; Ian Vickridge; Stephane Demiguel; Sebastien Massenot; Jean-Marc Belloir; Vincent Goiffon; Emmanuel Lhuillier

Enhanced Image Processing for the CASPEX Cameras Onboard the Rashid-1 Rover

SPACE SCIENCE REVIEWS

IF7.4

2024-08-12

PREAI

Theret, Nicolas; Cucchetti, Edoardo; Robert, Emilie; Virmontois, Cedric; Millancourt, Charles; Douaglin, Quentin; Amsili, Alice; Belloir, Jean-Marc; Amilineni, Santosh; Khoory, Mohammed; Ioannou, Zacharias; Lalucaa, Valerian; Lucas, Sylvain; Yana, Charles

Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications

SENSORS

IF3.5

2023-06-25

OAAI

Durnez, Clementine; Virmontois, Cedric; Panuel, Pierre; Antonsanti, Aubin; Goiffon, Vincent; Estribeau, Magali; Saint-Pe, Olivier; Lalucaa, Valerian; Berdin, Erick; Larnaudie, Franck; Belloir, Jean-Marc; Codreanu, Catalin; Chavanne, Ludovic

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage

SENSORS

IF3.5

2019-12-16

OAAI

Le Roch, Alexandre; Goiffon, Vincent; Marcelot, Olivier; Paillet, Philippe; Pace, Federico; Belloir, Jean-Marc; Magnan, Pierre; Virmontois, Cedric

Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors

OPTICS EXPRESS

IF3.3

2016-02-19

OAAI

Belloir, Jean-Marc; Goiffon, Vincent; Virmontois, Cedric; Raine, Melanie; Paillet, Philippe; Duhamel, Olivier; Gaillardin, Marc; Molina, Romain; Magnan, Pierre; Gilard, Olivier

X-ray lensless microscopy from undersampled diffraction intensities

PHYSICAL REVIEW B

IF3.7

2013-10-01

OAAI

Berenguer, F.; Godard, P.; Allain, M.; Belloir, J. -M.; Talneau, A.; Ravy, S.; Chamard, V.

研究方向