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收藏High-Temporal-Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h-BN Memristors高时间分辨率表征揭示了h-bn忆阻器中出色的随机电报噪声和介电击穿的起源
Pazos, Sebastian; Becker, Thales; Villena, Marco Antonio; Zheng, Wenwen; Shen, Yaqing; Yuan, Yue; Alharbi, Osamah; Zhu, Kaichen; Roldan, Juan Bautista; Wirth, Gilson; Palumbo, Felix; Lanza, Mario
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收藏Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller
Pazos, Sebastian; Zheng, Wenwen; Zanotti, Tommaso; Aguirre, Fernando; Becker, Thales; Shen, Yaqing; Zhu, Kaichen; Yuan, Yue; Wirth, Gilson; Puglisi, Francesco Maria; Roldan, Juan Bautista; Palumbo, Felix; Lanza, Mario
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