M. P. Seah - Publications, H-index & Citations

M. P. Seah

institute of nuclear chemistry technology

68H指数

404论文数

2.6W被引数

收录论文 53

发表时间

Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2020-10-14

PREAI

Pei, Yiwen; Cant, David J. H.; Havelund, Rasmus; Stewart, Mark; Mingard, Ken; Seah, Martin P.; Minelli, Caterina; Shard, Alexander G.

Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2019-01-03

OAAI

Tiddia, Mariavitalia; Mihara, Ichiro; Seah, Martin P.; Trindade, Gustavo Ferraz; Kollmer, Felix; Roberts, Clive J.; Hague, Richard; Mula, Guido; Gilmore, Ian S.; Havelund, Rasmus

Quantifying SIMS of Organic Mixtures and Depth ProfilesCharacterizing Matrix Effects of Fragment Ions 量化有机混合物的SIMS和深度轮廓表征碎片离子的基质效应

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

IF2.7

2018-10-23

PREAI

Seah, M. P.; Havelund, R.; Spencer, S. J.; Gilmore, I. S.

The matrix effect in secondary ion mass spectrometry 二次离子质谱中的基体效应

APPLIED SURFACE SCIENCE

IF6.9

2018-05-01

PREAI

Seah, M. P.; Shard, A. G.

SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions 有机材料的SIMS-使用负二次离子在氩气团簇深度剖面中的界面位置

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

IF2.7

2018-02-21

OAAI

Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2016-11-15

OAAI

Seah, M. P.; Havelund, R.; Gilmore, I. S.

Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample

ANALYTICAL CHEMISTRY

IF6.7

2016-10-26

PREAI

Vorng, Jean-Luc; Kotowska, Anna M.; Passarelli, Melissa K.; West, Andrew; Marshall, Peter S.; Havelund, Rasmus; Seah, Martin P.; Dollery, Colin T.; Rakowska, Paulina D.; Gilmore, Ian S.

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

IF2.7

2016-04-22

PREAI

Seah, Martin P.; Havelund, Rasmus; Gilmore, Ian S.

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

ANALYTICAL CHEMISTRY

IF6.7

2016-03-09

PREAI

Yokoyama, Yuta; Aoyagi, Satoka; Fujii, Makiko; Matsuo, Jiro; Fletcher, John S.; Lockyer, Nicholas P.; Vickerman, John C.; Passarelli, Melissa K.; Havelund, Rasmus; Seah, Martin P.

Determination of the sputtering yield of cholesterol using Arn+ and C60+(+) cluster ions

ANALYST

IF3.3

2016-01-01

PREAI

Rakowska, P. D.; Seah, M. P.; Vorng, J. -L.; Havelund, R.; Gilmore, I. S.

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

ANALYST

IF3.3

2015-01-01

PREAI

Seah, M. P.; Spencer, S. J.; Havelund, R.; Gilmore, I. S.; Shard, A. G.

Quantitative characterization of defect size in graphene using Raman spectroscopy

APPLIED PHYSICS LETTERS

IF3.6

2014-12-24

OAAI

Pollard, Andrew J.; Brennan, Barry; Stec, Helena; Tyler, Bonnie J.; Seah, Martin P.; Gilmore, Ian S.; Roy, Debdulal

VAMAS Inter laboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy (vol 86, pg 9603, 2014)

ANALYTICAL CHEMISTRY

IF6.7

2014-10-31

PREAI

Gurdak, Elzbieta; Green, Felicia M.; Rakowska, Paulina D.; Seah, Martin P.; Salter, Tara L.; Gilmore, Ian S.

VAMAS Interlaboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy

ANALYTICAL CHEMISTRY

IF6.7

2014-09-26

PREAI

Gurdak, Elzbieta; Green, Felicia M.; Rakowska, Paulina D.; Seah, Martin P.; Salter, Tara L.; Gilmore, Ian S.

Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics 有机物三维二次离子质谱成像中的电子泛炮损伤效应

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

IF2.7

2014-06-10

PREAI

Havelund, Rasmus; Seah, Martin P.; Shard, Alexander G.; Gilmore, Ian S.

Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2014-06-06

PREAI

Seah, Martin P.; Havelund, Rasmus; Gilmore, Ian S.

Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2013-07-25

PREAI

Yang, Li; Seah, Martin P.; Gilmore, Ian S.; Morris, Richard J. H.; Dowsett, Mark G.; Boarino, Luca; Sparnacci, Katia; Laus, Michele

Universal Equation for Argon Gas Cluster Sputtering Yields

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2013-06-10

146

PREAI

Seah, M. P.

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2012-10-24

PREAI

Yang, Li; Seah, Martin P.; Gilmore, Ian S.

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

ANALYTICAL CHEMISTRY

IF6.7

2012-09-05

134

PREAI

Shard, Alexander G.; Havelund, Rasmus; Seah, Martin P.; Spencer, Steve J.; Gilmore, Ian S.; Winograd, Nicholas; Mao, Dan; Miyayama, Takuya; Niehuis, Ewald; Rading, Derk; Moellers, Rudolf

研究方向