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J

Jaewoong Shim

seoul national university of science and technology

9H指数
17论文数
244被引数
收录论文 12
发表时间
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Multiple instance learning for SSD failure prediction under customer failure-biased labels基于客户故障偏差标签的SSD故障预测的多实例学习
errComputers & Industrial Engineering
IF6.5
err2026-07-06
err0
PREAI
errBongjun Choi; Jeongwon Park; Hyung-Seok Kang; Jaewoong Shim
err分享
err收藏
Cost-effective anomaly detection with active learning基于主动学习的低成本异常检测
errComputers & Industrial Engineering
IF6.5
err2026-04-21
err0
PREAI
errSohee Bae; Jaewoong Shim
err分享
err收藏
A plug-in module for detecting and explaining anomalies in inter-variable dependencies in multivariate time series用于检测和解释多变量时间序列中变量间依赖关系异常的插件模块
errExpert Systems with Applications
IF7.5
err2026-02-28
err0
PREAI
errJeongwon Park; Jaewoong Shim
err分享
err收藏
Frost forecasting via weakly-supervised semantic segmentation of satellite imagery通过弱监督语义分割进行卫星图像的霜冻预测
errGISCIENCE & REMOTE SENSING
IF6.9
err2025-05-02
err0
errOAAI
errSeokho Kang; Seon-Kyeong Seong; Eunha Sohn; Jiyoung Kim; Jaewoong Shim
err分享
err收藏
Environmentally-Robust Defect Classification With Domain Augmentation Framework基于域扩展框架的环境鲁棒缺陷分类
errIEEE ACCESS
IF3.6
err2024-01-01
err0
errOAAI
errLee, Sungho; Shim, Jaewoong
err分享
err收藏
Learning from single-defect wafer maps to classify mixed-defect wafer maps从单缺陷晶片图学习，对混合缺陷晶片图进行分类
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2023-12-01
err6
PREAI
errShim, Jaewoong; Kang, Seokho
err分享
err收藏
Domain-adaptive active learning for cost-effective virtual metrology modeling用于经济高效的虚拟计量建模的域自适应主动学习
errCOMPUTERS IN INDUSTRY
IF9.1
err2022-02-01
err7
PREAI
errShim, Jaewoong; Kang, Seokho
err分享
err收藏
Active cluster annotation for wafer map pattern classification in semiconductor manufacturing
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2021-11-01
err14
PREAI
errShim, Jaewoong; Kang, Seokho; Cho, Sungzoon
err分享
err收藏
Adaptive fault detection framework for recipe transition in semiconductor manufacturing
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2021-11-01
err13
PREAI
errShim, Jaewoong; Cho, Sungzoon; Kum, Euiseok; Jeong, Suho
err分享
err收藏
Active inspection for cost-effective fault prediction in manufacturing process
errJOURNAL OF PROCESS CONTROL
IF3.9
err2021-09-01
err7
PREAI
errShim, Jaewoong; Kang, Seokho; Cho, Sungzoon
err分享
err收藏
Product failure prediction with missing data
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2017-11-29
err19
PREAI
errKang, Seokho; Kim, Eunji; Shim, Jaewoong; Chang, Wonsang; Cho, Sungzoon
err分享
err收藏
Mining the relationship between production and customer service data for failure analysis of industrial products
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2017-04-01
err27
PREAI
errKang, Seokho; Kim, Eunji; Shim, Jaewoong; Cho, Sungzoon; Chang, Wonsang; Kim, Junhwan
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
S
Sungzoon Cho
H 指数: 37 · 论文数: 197
S
Seokho Kang
H 指数: 28 · 论文数: 98
E
Eunji Kim
H 指数: 26 · 论文数: 142
J
Junhwan Kim
H 指数: 13 · 论文数: 64
J
J.H. Park
H 指数: 11 · 论文数: 26
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