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收藏Analysis of the influence of defect evolution on the performance and damage of 4H-SiC photoconductive semiconductor switches缺陷演化对4H-SiC光电导半导体开关性能和损伤的影响分析
Chen, Zhipeng; Huang, Zhuocheng; Sun, Qian; Xu, Kun; Lin, Zhouyang; Zheng, Zhong; Wu, Zhaoyang; Zhang, Wei; Guo, Hui; Liu, Yapeng; Zhang, Yuming; Peng, Bo; Wang, Yutian
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