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Miroslav Valtr

czech metrology institute

14H指数
68论文数
606被引数
收录论文 14
发表时间
The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography表面形貌挑战:一项多实验室基准研究以推进形貌表征
err2025-07-26
err0
errOAAI
errA. Pradhan; M. H. Müser; N. Miller; J. P. Abdelnabe; L. Afferrante; D. Albertini; D. A. Aldave; L. Algieri; N. Ali; A. Almqvist; T. Amann; P. Ares; B. N. Balzer; L. Baugh; E. A. Berberich; M. Björling; M. S. Bobji; F. Bottiglione; B. Brodmann; W. Cai; G. Carbone; R. W. Carpick; F. Cassin; J. Cayer-Barrioz; M. I. Chowdhury; M. Ciavarella; E. Cihan; D. Huang; E. Delplanque; A. J. Deptula; S. Descartes; A. Dhinojwala; M. Dienwiebel; D. Dini; A. C. Dunn; C. Edwards; M. Eriten; A. Esawi; R. M. Espinosa-Marzal; L. Fang; A. Fatemi; C. Fidd; D. Gabriel; F. Gaslain; G. Giordano; J. Gómez-Herrero; L. Gontard; N. N. Gosvami; G. Greenwood; C. Greiner; T. Grejtak; A. Haroun; M. Hasan; S. Hoppe; L. Isa; R. L. Jackson; S. Jang; O. Johnson; F. Kaiser; M. Kalin; K. Kalliorinne; P. H. Karanjkar; S. H. Kim; S. Kinzelberger; P. Klapetek; B. A. Krick; C. Kumar; N. Kumar; S. Kumar; P. LaMascus; R. Larsson; P. Laux; M. J. Lee; P. M. Lee; W. Lee; C. Leriche; J. Li; Y. Li; Y. -S. Li; T. A. Lubrecht; I. A. Lyashenko; C. Ma; T. Ma; F. Maaboudallah; S. Mahmood; F. Mangolini; M. Marian; D. Mazuyer; Y. Meng; N. Menga; T. Miller; D. M. Mulvihill; M. Najah; D. Nečas; C. I. Papadopoulos; A. Papangelo; M. Pauli; B. N. J. Persson; A. Peterson; A. A. Pitenis; P. Podsiadlo; M. Polajnar; V. L. Popov; T. Požar; A. Prasad; G. Prieto; C. Putignano; M. H. Rahman; S. B. Ramisetti; S. Raumel; I. J. Reyes; N. Rodriguez; M. Rodríguez Ripoll; H. Rojacz; P. Sainsot; A. Samodurova; D. Savio; M. Scaraggi; F. Schaefer; S. W. Scherrer; K. D. Schulze; K. E. Shaffer; M. A. Sidebottom; D. Skaltsas; J. Soni; C. Spies; G. W. Stachowiak; L. Steinhoff; N. C. Strandwitz; K. Sun; S. Tripathi; W. R. Tuckart; S. Ugar; M. Valtr; K. E. Van Meter; J. Vdovak; J. G. Vilhena; G. Violano; G. Vorlaufer; M. Walczak; B. Weber; T. Woloszynski; M. Wolski; A. Yadav; V. A. Yastrebov; M. Yongjian; L. Yuan; J. Yus; J. Zhang; X. Zhang; Q. Zheng; L. Pastewka; T. D. B. Jacobs
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GSvit - An open source FDTD solver for realistic nanoscale optics simulations
err2021-08-01
err3
errOAAI
errKlapetek, Petr; Grolich, Petr; Nezval, David; Valtr, Miroslav; Slesinger, Radek; Necas, David
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SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis
err2020-10-01
err13
errOAAI
errGuen, Eloise; Klapetek, Petr; Puttock, Robert; Hay, Bruno; Allard, Alexandre; Maxwell, Tony; Chapuis, Pierre-Olivier; Renahy, David; Davee, Guillaume; Valtr, Miroslav; Martinek, Jan; Kazakova, Olga; Gomes, Severine
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Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy
err2017-05-01
err11
errOAAI
errKlapetek, Petr; Martinek, Jan; Grolich, Petr; Valtr, Miroslav; Kaur, Nupinder Jeet
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AFM and SEM-FEG study on fundamental mechanisms leading to fatigue crack initiation
err2015-07-01
err32
PREAI
errMan, J.; Valtr, M.; Petrenec, M.; Dluhos, J.; Kubena, I.; Obrtlik, K.; Polak, J.
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Protective double-layer coatings prepared by plasma enhanced chemical vapor deposition on tool steel
err2015-06-01
err11
PREAI
errMuresan, Mihai-George; Campbell, Anna Charvatova; Ondracka, Pavel; Bursikova, Vilma; Perina, Vratislav; Polcar, Tomas; Reuter, Stephan; Hammer, Malte U.; Valtr, Miroslav; Zajickova, Lenka
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Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
errSENSORS
IF3.5
err2014-01-07
err12
errOAAI
errLazar, Josef; Klapetek, Petr; Valtr, Miroslav; Hrabina, Jan; Buchta, Zdenek; Cip, Onrej; Cizek, Martin; Oulehla, Jindrich; Sery, Mojmir
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Voice coil-based scanning probe microscopy
err2012-06-21
err5
errOAAI
errKlapetek, Petr; Valtr, Miroslav; Duchon, Vaclav; Sobota, Jaroslav
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Non-equidistant scanning approach for millimetre-sized SPM measurements
err2012-04-11
err10
errOAAI
errKlapetek, Petr; Valtr, Miroslav; Bursik, Petr
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Atomic force microscopy analysis of nanoparticles in non-ideal conditions
err2011-08-30
err106
errOAAI
errKlapetek, Petr; Valtr, Miroslav; Necas, David; Salyk, Ota; Dzik, Petr
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Rough surface scattering simulations using graphics cards
err2010-07-01
err9
PREAI
errKlapetek, Petr; Valtr, Miroslav; Poruba, Ales; Necas, David; Ohlidal, Miloslav
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