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Kenichi Fujii

Osaka Institute of Technology

34H指数
292论文数
4.3K被引数
收录论文 42
发表时间
Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry
err2022-01-01
err3
PREAI
errFujita, Kazuaki; Fujii, Kenichi; Zhang, Lulu; Azuma, Yasushi; Mizushima, Shigeki; Kuramoto, Naoki
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Total reflection hard x-ray photoelectron spectroscopy: Applications to strongly correlated electron systems
err2021-05-07
err1
PREAI
errMizutani, T.; Tanaka, S.; Saze, T.; Fujii, K.; Matsuoka, H.; Nakano, M.; Wadati, H.; Kitamura, M.; Horiba, K.; Iwasa, Y.; Kumigashira, H.; Yoshiki, M.; Taguchi, M.
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Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ
err2021-01-01
err4
errOAAI
errKuramoto, Naoki; Mizushima, Shigeki; Zhang, Lulu; Fujita, Kazuaki; Okubo, Sho; Inaba, Hajime; Azuma, Yasushi; Kurokawa, Akira; Ota, Yuichi; Fujii, Kenichi
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Volume Measurement of a 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ
err2019-06-01
err7
errOAAI
errKuramoto, Naoki; Zhang, Lulu; Fujita, Kazuaki; Okubo, Sho; Inaba, Hajime; Fujii, Kenichi
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Realization of the Kilogram Based on the Planck Constant at NMIJ
err2017-06-01
err17
PREAI
errKuramoto, Naoki; Zhang, Lulu; Mizushima, Shigeki; Fujita, Kazuaki; Azuma, Yasushi; Kurokawa, Akira; Fujii, Kenichi
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Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS
err2017-06-01
err28
PREAI
errZhang, Lulu; Kuramoto, Naoki; Azuma, Yasushi; Kurokawa, Akira; Fujii, Kenichi
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Uniformity Evaluation of Lattice Spacing of 28Si Single Crystals
err2017-06-01
err6
PREAI
errWaseda, Atsushi; Fujimoto, Hiroyuki; Zhang, Xiao Wei; Kuramoto, Naoki; Fujii, Kenichi
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The Correlation of the NA Measurements by Counting 28Si Atoms
err2015-07-14
err21
errOAAI
errMana, G.; Massa, E.; Sasso, C. P.; Stock, M.; Fujii, K.; Kuramoto, N.; Mizushima, S.; Narukawa, T.; Borys, M.; Busch, I.; Nicolaus, A.; Pramann, A.
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Improvements to the Volume Measurement of 28Si Spheres to Determine the Avogadro Constant
err2015-06-01
err16
PREAI
errKuramoto, Naoki; Azuma, Yasushi; Inaba, Hajime; Hong, Feng-Lei; Fujii, Kenichi
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Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals
err2015-06-01
err10
PREAI
errWaseda, Atsushi; Fujimoto, Hiroyuki; Zhang, Xiao Wei; Kuramoto, Naoki; Fujii, Kenichi
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Surface Layer Analysis of Si Sphere by XRF and XPS
err2015-06-01
err13
PREAI
errZhang, Lulu; Azuma, Yasushi; Kurokawa, Akira; Kuramoto, Naoki; Fujii, Kenichi
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International comparison of volume measurement for a 1 kg silicon sphere between KRISS and NMIJ
err2014-03-01
err1
PREAI
errKuramoto, Naoki; Chang, Kyung Ho; Fujii, Kenichi; Lee, Yong Jae
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