logo
科言猫学术研究的AI总结
language
手机端手机端
  • Phone Feature微信小程序
简体中文简体中文
notice消息通知
博客博客
delete
arrow
返回
J

Jau-Shiung Fang

National Formosa University

16H指数
134论文数
1.1K被引数
收录论文 36
发表时间
logo
Ultrathin W2N barrier enabling texture-engineered cobalt interconnects with enhanced electromigration reliability超薄W₂N阻挡层实现纹理工程化钴互连线并提高电迁移可靠性
errJournal of Alloys and Compounds
IF6.3
err2026-04-26
err0
PREAI
errJau-Shiung Fang; Yu-Shun Chang; Yi-Lung Chen; Chun-Wei Huang; Giin-Shan Chen
err分享
err收藏
Formation and thickness-dependent resistivity scaling of C54-TiSi2, CoSi2, and NiSi thin filmsC54-TiSi2、CoSi2和NiSi薄膜的形成及其厚度相关的电阻率标度关系
errJournal of Alloys and Compounds
IF6.3
err2026-04-23
err0
PREAI
errYi-Yen Chen; Guan-Ting Liu; Ting-Kan Tsai; Jau-Shiung Fang
err分享
err收藏
Mechanisms of resistivity minimum for thin cobalt films with enhanced bias-stressing resistance by dilute copper alloying通过稀铜合金化增强偏压应力抵抗力的薄钴膜电阻率最小值的机制
errMaterials Chemistry and Physics
IF4.7
err2026-03-04
err0
PREAI
errJau-Shiung Fang; Jui-Cheng Chen; Shang-Jui Chiu; Chun-Wei Huang; Yi-Lung Cheng; Giin-Shan Chen
err分享
err收藏
Optical properties and thermal stability of colored molybdenum oxide-based spectrally selective absorbers彩色钼氧化物基光谱选择性吸收体的光学性能和热稳定性
errSolar Energy
IF6.6
err2025-11-24
err0
PREAI
errSheng-Jen Cheng; Jau-Shiung Fang; Yi-Yen Chen; Ting-Kan. Tsai
err分享
err收藏
Phase-coherent dilute ruthenium-enhanced cobalt films with improved thermal stability and breakdown strength for interconnect metallization相干相稀疏 ruthenium 增强型 cobalt 薄膜，具有改进的热稳定性与击穿强度，适用于互连金属化
errTHIN SOLID FILMS
IF2
err2025-10-01
err0
PREAI
errChen, Yi-Yen; Zhan, Jun-Neng; Fang, Jau-Shiung
err分享
err收藏
Electrolessly Deposited Co (0.20 at%)-Modified Cu with Greater Thermal- and Electrical Stress-Induced Reliability than Co化学镀沉积的Co (0.20 at%)-改性的Cu，其热应力和电应力诱导的可靠性高于Co。
errJournal of The Electrochemical Society
IF3.3
err2025-08-29
err0
errOAAI
errJau-Shiung Fang; Po-Chun Chen; Yi-Lung Cheng; Giin-Shan Chen
err分享
err收藏
Influence of trace tungsten contents on thin-film properties and electromigration behaviors of electroless-deposited cobalt interconnect lines
errMATERIALS RESEARCH BULLETIN
IF5.7
err2025-06-01
err0
PREAI
errFang, Jau-Shiung; Su, Ting-Hsun; Cheng, Yi-Lung; Huang, Chun-Wei; Chen, Giin-Shan
err分享
err收藏
The impact of titanium alloying on altering nanomechanical properties and grain structures of sputter-deposited cobalt for electromigration reliability enhancement
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2024-10-01
err0
PREAI
errChen, Giin-Shan; Lin, Meng-Jie; Huang, Chun-Wei; Cheng, Yi-Lung; Fang, Jau-Shiung; Lin, Chih-I.
err分享
err收藏
The feasibility of an ultrathin dual-barrier scheme to inhibit interfacial diffusion and reactions in contact stacks of Co/NiSi/Si
errSURFACES AND INTERFACES
IF6.3
err2024-08-01
err1
PREAI
errHsiao, Chien -Nan; Pan, Yen-Chang; Chen, Wei -Chun; Cheng, Yi-Lung; Fang, Jau-Shiung; Su, Ting-Hsun; Lin, Meng-Jie; Chen, Giin-Shan
err分享
err收藏
Ultrasound assistance in the sensitization and activation of porous Al2O3 supports for improving the hydrogen separation of Pd/Al2O3 composite membranes
errINTERNATIONAL JOURNAL OF HYDROGEN ENERGY
IF8.3
err2024-02-01
err2
PREAI
errTsai, T. K.; Lu, Y. K.; Fang, J. S.; Chen, G. S.
err分享
err收藏
Understanding electromigration failure behaviors of narrow cobalt lines and the mechanism of reliability enhancement for extremely dilute alloying of manganese oxide
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2024-01-01
err5
errOAAI
errFang, Jau-Shiung; Chen, Giin-Shan; Chang, Chin-Chia; Hsiao, Chien-Nan; Chen, Wei-Chun; Cheng, Yi-Lung
err分享
err收藏
Reinforcement in electromigration reliability of Cu interconnects by alloying of extremely dilute MnO
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2023-08-01
err0
PREAI
errFang, Jau-Shiung; Lee, Ching-En; Cheng, Yi-Lung; Chen, Giin-Shan
err分享
err收藏
Comparison of CoW/SiO2 and CoB/SiO2 Interconnects from the Perspective of Electrical and Reliability Characteristics
errMATERIALS
IF3.2
err2023-02-09
err0
errOAAI
errCheng, Yi-Lung; Wang, Kai-Hsieh; Lee, Chih-Yen; Chen, Giin-Shan; Fang, Jau-Shiung
err分享
err收藏
Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials
errMOLECULES
IF4.6
err2023-01-23
err2
errOAAI
errCheng, Yi-Lung; Peng, Wei-Fan; Huang, Chi-Jia; Chen, Giin-Shan; Fang, Jau-Shiung
err分享
err收藏
Dual near-zero-thickness sealing for the strengthening of cobalt thin films and nanolines for future interconnect applications
errAPPLIED SURFACE SCIENCE
IF6.9
err2023-01-01
err4
PREAI
errChen, Giin-Shan; Pan, Yen-Chang; Chen, Wei -Chun; Hsiao, Chien -Nan; Chang, Chin -Chia; Cheng, Yi-Lung; Fang, Jau-Shiung
err分享
err收藏
Enhancement of Electromigration Reliability of Electroless-Plated Nanoscaled Copper Interconnects by Complete Encapsulation of a 1 nm-Thin Self-Assembled Monolayer
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2022-08-24
err4
PREAI
errChen, Giin-Shan; Lee, Ching-En; Cheng, Yi-Lung; Fang, Jau-Shiung; Hsiao, Chien-Nan; Chen, Wei-Chun; Chang, Yiu-Hsiang; Pan, Yen-Chang; Lee, Wei; Su, Ting-Hsun
err分享
err收藏
Synthesis of Dilute Phosphorous-Embedded Co Alloy Films on a NiSi Substrate with a Superior Gap-Filling Capability for Nanoscale Interconnects
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2021-04-14
err5
PREAI
errFang, Jau-Shiung; Wu, Yu-Lin; Cheng, Yi-Lung; Chen, Giin-Shan
err分享
err收藏
Chemical-Structure Evolution Model for the Self-Assembling of Amine-Terminated Monolayers on Nanoporous Carbon-Doped Organosilicate in Tightly Controlled Environments
errLANGMUIR
IF3.9
err2020-12-03
err15
PREAI
errFang, Jau-Shiung; Yang, Tzu-Ming; Pan, Yen-Chang; Lai, Guan-Yu; Cheng, Yi-Lung; Chen, Giin-Shan
err分享
err收藏
Mechanism of strengthening electroless plated copper films with extremely dilute oxide dispersion alloying: The optimal MnO addition
errAPPLIED SURFACE SCIENCE
IF6.9
err2020-10-01
err8
PREAI
errChen, Giin-Shan; Tau, Ren-Jie; Fang, Jau-Shiung; Cheng, Yi-Lung; Chen, Yen-Chin
err分享
err收藏
Electrical Characteristics and Reliability of Nitrogen-Stuffed Porous Low-k SiOCH/Mn2O3-xN/Cu Integration
errMOLECULES
IF4.6
err2019-10-28
err9
errOAAI
errCheng, Yi-Lung; Lin, Yu-Lu; Lee, Chih-Yen; Chen, Giin-Shan; Fang, Jau-Shiung
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
J
Jinn P. Chu
H 指数: 42 · 论文数: 289
Y
Yen‐Ting Chen
H 指数: 37 · 论文数: 230
W
Wei Lee
H 指数: 35 · 论文数: 300
C
Chun‐Wei Huang
H 指数: 33 · 论文数: 194
T
Tsung‐Shune Chin
H 指数: 31 · 论文数: 229
查看更多