Ivan Ohlı́dal - Publications, H-index & Citations

Ivan Ohlı́dal

masaryk university

26H指数

243论文数

3.2K被引数

收录论文 30

发表时间

Combined method of multi-pixel and multi-sample imaging spectroscopic reflectometry for the optical characterization of non-uniform thin films with transition layers 多像素与多样本成像光谱反射法联合方法用于具有过渡层的非均匀薄膜的光学表征

Measurement Science and Technology

IF3.4

2026-02-16

PREAI

Jiří Vohánka; Ivan Ohlídal; Václav Šulc

Determination of refractive index of crystalline silicon in the infrared region on the basis of interference pattern observed in thick slab 基于在厚板上观察到的干涉图样对晶体硅在红外区域的折射率进行测定

INFRARED PHYSICS & TECHNOLOGY

IF3.4

2025-06-06

PREAI

Vohanka, Jiri; Vecere, Jiri; Franta, Daniel; Ohlidal, Ivan

Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model 通过通用色散模型对五氧化二铌 (Nb2O5) 薄膜进行宽光谱范围光学表征

OPTICAL MATERIALS

IF4.2

2024-11-01

PREAI

Franta, Daniel; Hroncova, Beata; Dvorak, Jan; Vohanka, Jiri; Franta, Pavel; Ohlidal, Ivan; Pekar, Vaclav; Skoda, David

Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition

HELIYON

IF3.6

2024-03-01

OAAI

Dvorak, Jan; Vohanka, Jiri; Bursikova, Vilma; Ohlidal, Ivan

Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies

OPTICS EXPRESS

IF3.3

2022-10-07

OAAI

Ohlidal, Ivan; Vohanka, Jiri; Bursikova, Vilma; Dvorak, Jan; Klapetek, Petr; Kaur, Nupinder Jeet

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

APPLIED SURFACE SCIENCE

IF6.9

2020-12-01

PREAI

Vohanka, Jiri; Sustek, Stepan; Bursikova, Vilma; Sklibova, Veronika; Sulc, Vaclav; Homola, Vojtech; Franta, Daniel; Cermak, Martin; Ohlidal, Miloslav; Ohlidal, Ivan

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films

OPTICS EXPRESS

IF3.3

2020-11-18

OAAI

Ohlidal, Ivan; Vohanka, Jiri; Bursikova, Vilma; Sulc, Vaclav; Sustek, Stepan; Ohlidal, Miloslav

Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials

OPTICS EXPRESS

IF3.3

2020-02-13

OAAI

Vohanka, Jiri; Franta, Daniel; Cermak, Martin; Homola, Vojtech; Bursikova, Vilma; Ohlidal, Ivan

Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers

OPTICS EXPRESS

IF3.3

2019-12-23

OAAI

Ohlidal, Ivan; Vohanka, Jiri; Bursikova, Vilma; Franta, Daniel; Cermak, Martin

Temperature-dependent dispersion model of float zone crystalline silicon

APPLIED SURFACE SCIENCE

IF6.9

2017-11-01

PREAI

Franta, Daniel; Dubroka, Adam; Wang, Chennan; Giglia, Angelo; Vohanka, Jiri; Franta, Pavel; Ohlidal, Ivan

Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry

APPLIED SURFACE SCIENCE

IF6.9

2017-11-01

PREAI

Franta, Daniel; Kotilainen, Minna; Krumpolec, Richard; Ohlidal, Ivan

Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness

APPLIED SURFACE SCIENCE

IF6.9

2017-11-01

PREAI

Ohlidal, Ivan; Franta, Daniel; Necas, David

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

APPLIED SURFACE SCIENCE

IF6.9

2017-11-01

PREAI

Franta, Daniel; Necas, David; Giglia, Angelo; Franta, Pavel; Ohlidal, Ivan

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory

APPLIED SURFACE SCIENCE

IF6.9

2017-10-01

PREAI

Ohlidal, Ivan; Vohanka, Jiri; Cermak, Martin; Franta, Daniel

Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

ADVANCED OPTICAL MATERIALS

IF7.2

2016-07-14

380

OAAI

Siefke, Thomas; Kroker, Stefanie; Pfeiffer, Kristin; Puffky, Oliver; Dietrich, Kay; Franta, Daniel; Ohlidal, Ivan; Szeghalmi, Adriana; Kley, Ernst-Bernhard; Tuennermann, Andreas

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

APPLIED SURFACE SCIENCE

IF6.9

2015-09-01

PREAI

Necas, David; Vodak, Jiri; Ohlidal, Ivan; Ohlidal, Miloslav; Majumdar, Abhijit; Zajickkova, Lenka

Consolidated series for efficient calculation of the reflection and transmission in rough multilayers

OPTICS EXPRESS

IF3.3

2014-02-20

OAAI

Necas, David; Ohlidal, Ivan