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Robert Kaplar

Sandia National Laboratories

33H指数
345论文数
4.6K被引数
收录论文 24
发表时间
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Detecting defects that reduce breakdown voltage using machine learning and optical profilometry
err2024-03-28
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errGallagher, James C.; Mastro, Michael A.; Jacobs, Alan G.; Kaplar, Robert. J.; Hobart, Karl D.; Anderson, Travis J.
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Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design
err2024-03-25
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errSenarath, A. S.; Islam, S.; Sengupta, A.; McCurdy, M. W.; Anderson, T.; Jacobs, A.; Kaplar, R.; Ball, D. R.; Zhang, E. X.; Pantelides, S. T.; Reed, R. A.; Ebrish, M. A.; Fleetwood, D. M.; Caldwell, J. D.; Schrimpf, R. D.
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A Review of GaN HEMT Dynamic ON-Resistance and Dynamic Stress Effects on Field Distribution
err2024-01-01
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PREAI
errGill, Lee; DasGupta, Sandeepan; Neely, Jason C.; Kaplar, Robert J.; Michaels, Alan J.
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Microstructural evolution of extended defects in 25 μm thick GaN homo-epitaxial layers
err2023-06-12
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errLiao, Michael E.; Mahadik, Nadeemullah A.; Gallagher, James C.; Gunning, Brendan P.; Kaplar, Robert J.; Anderson, Travis J.
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Cascaded SiC JFET Topology for High-Voltage Solid-State Circuit Breaker Applications
err2023-03-01
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PREAI
errRodriguez, Luciano Andres Garcia; Gill, Lee; Mueller, Jacob A.; Neely, Jason; Baker, Gary; Flicker, Jack; Schrock, Emily; Pickrell, Gregory; Kaplar, Robert
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Using machine learning with optical profilometry for GaN wafer screening
err2023-02-27
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errGallagher, James C.; Mastro, Michael A.; Ebrish, Mona A.; Jacobs, Alan G.; Gunning, Brendan P.; Kaplar, Robert J.; Hobart, Karl D.; Anderson, Travis J.
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Identification of the defect dominating high temperature reverse leakage current in vertical GaN power diodes through deep level transient spectroscopy
err2022-01-31
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errDasGupta, S.; Slobodyan, O.; Smith, T.; Binder, A.; Flicker, J.; Kaplar, R.; Mueller, J.; Garcia Rodriguez, L.; Atcitty, S.
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Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques
err2022-01-13
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errGallagher, James C.; Ebrish, Mona A.; Porter, Matthew A.; Jacobs, Alan G.; Gunning, Brendan P.; Kaplar, Robert J.; Hobart, Karl D.; Anderson, Travis J.
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Ultrawide bandgap semiconductors
err2021-05-17
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errHigashiwaki, Masataka; Kaplar, Robert; Pernot, Julien; Zhao, Hongping
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High Temperature and Power Dependent Photoluminescence Analysis on Commercial Lighting and Display LED Materials for Future Power Electronic Modules
err2019-11-14
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errSabbar, Abbas; Madhusoodhanan, Syam; Al-Kabi, Sattar; Dong, Binzhong; Wang, Jiangbo; Atcitty, Stanley; Kaplar, Robert; Ding, Ding; Mantooth, Alan; Yu, Shui-Qing; Chen, Zhong
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Multidimensional thermal analysis of an ultrawide bandgap AlGaN channel high electron mobility transistor
err2019-10-09
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errLundh, James Spencer; Chatterjee, Bikramjit; Song, Yiwen; Baca, Albert G.; Kaplar, Robert J.; Beechem, Thomas E.; Allerman, Andrew A.; Armstrong, Andrew M.; Klein, Brianna A.; Bansal, Anushka; Talreja, Disha; Pogrebnyakov, Alexej; Heller, Eric; Gopalan, Venkatraman; Redwing, Joan M.; Foley, Brian M.; Choi, Sukwon
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Ultrafast Reverse Recovery Time Measurement for Wide-Bandgap Diodes
err2017-12-01
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errMauch, Daniel L.; Zutavern, Fred J.; Delhotal, Jarod J.; King, Michael P.; Neely, Jason C.; Kizilyalli, Isik C.; Kaplar, Robert J.
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Identification of the primary compensating defect level responsible for determining blocking voltage of vertical GaN power diodes
err2016-10-31
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PREAI
errKing, M. P.; Kaplar, R. J.; Dickerson, J. R.; Lee, S. R.; Allerman, A. A.; Crawford, M. H.; Fischer, A. J.; Marinella, M. J.; Flicker, J. D.; Fleming, R. M.; Kizilyalli, I. C.; Aktas, O.; Armstrong, A. M.
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An AlN/Al0.85Ga0.15N high electron mobility transistor
err2016-07-22
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errBaca, Albert G.; Armstrong, Andrew M.; Allerman, Andrew A.; Douglas, Erica A.; Sanchez, Carlos A.; King, Michael P.; Coltrin, Michael E.; Fortune, Torben R.; Kaplar, Robert J.
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Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content
err2015-09-09
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errPaisley, Elizabeth A.; Brumbach, Michael; Allerman, Andrew A.; Atcitty, Stanley; Baca, Albert G.; Armstrong, Andrew M.; Kaplar, Robert J.; Ihlefeld, Jon F.
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Insulated gate bipolar transistor reliability testing protocol for PV inverter applications
err2013-01-16
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PREAI
errFlicker, Jack; Kaplar, Robert; Yang, Benjamin; Marinella, Matthew; Granata, Jennifer
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