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Simon G. Alcock

diamond light source

23H指数
99论文数
1.6K被引数
收录论文 13
发表时间
Application and performance of the novel Elcomat 5000 autocollimator in slope-measuring profilometry of beamline optics新型Elcomat 5000自准直仪在光束线光学斜率测量轮廓术中的应用与性能
err2026-01-01
err0
PREAI
errGeckeler, Ralf D.; Just, Andreas; Krause, Michael; Alcock, Simon G.; da Silva, Murilo Bazan; Nistea, Ioana-Theodora; English, Damon; Rochester, Simon; Yashchuk, Valeriy V.
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Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
errOPTICA
IF8.5
err2023-01-25
err9
errOAAI
errAlcock, Simon G.; NIsTEA, Ioana-theodora; Badami, Vivek G.; Signorato, Riccardo; FusCO, Matteo; Hu, Lingfei; Wang, Hongchang; Sawhney, Kawal
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Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors
err2022-05-26
err8
errOAAI
errMercurio, Giuseppe; Chalupsky, Jaromir; Nistea, Ioana-Theodora; Schneider, Michael; Hajkova, Vera; Gerasimova, Natalia; Carley, Robert; Cascella, Michele; Le Guyader, Loic; Mercadier, Laurent; Schlappa, Justine; Setoodehnia, Kiana; Teichmann, Martin; Yaroslavtsev, Alexander; Burian, Tomas; Vozda, Vojtech; Vysin, Ludek; Wild, Jan; Hickin, David; Silenzi, Alessandro; Stupar, Marijan; Delitz, Jan Torben; Broers, Carsten; Reich, Alexander; Pfau, Bastian; Eisebitt, Stefan; La Civita, Daniele; Sinn, Harald; Vannoni, Maurizio; Alcock, Simon G.; Juha, Libor; Scherz, Andreas
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1 m long multilayer-coated deformable piezoelectric bimorph mirror for adjustable focusing of high-energy X-rays
err2019-05-22
err19
PREAI
errSutter, John P.; Chater, Philip A.; Signorato, Riccardo; Keeble, Dean S.; Hillman, Michael R.; Tucker, Matthew G.; Alcock, Simon G.; Nistea, Ioana-Theodora; Wilhelm, Heribert
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Growth, morphology, and structure of a monolayer thick GdFe2 surface alloy
err2016-08-15
err1
errOAAI
errWilliams, R. P.; Alcock, S. G.; Howes, P. B.; Nicklin, C. L.
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Fast optimization of a bimorph mirror using x-ray grating interferometry
err2014-04-15
err34
PREAI
errWang, Hongchang; Sawhney, Kawal; Berujon, Sebastien; Sutter, John; Alcock, Simon G.; Wagner, Ulrich; Rau, Christoph
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At-wavelength metrology of hard X-ray mirror using near field speckle
err2014-03-12
err56
errOAAI
errBerujon, Sebastien; Wang, Hongchang; Alcock, Simon; Sawhney, Kawal
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Probing the average size of self-assembled metal nanoparticles using x-ray standing waves
err2009-07-30
err21
PREAI
errTiwari, M. K.; Sawhney, K. J. S.; Lee, Tien-Lin; Alcock, S. G.; Lodha, G. S.
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Atomic structure of CaF2/MnF2-Si(111) superlattices from X-ray diffraction
err2007-02-01
err1
PREAI
errAlcock, Simon G.; Nicklin, C. L.; Howes, P. B.; Norris, C. A.; Kyutt, R. N.; Sokolov, N. S.; Yakovlev, N. L.
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