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Chengyuan Yao

tianjin university

7H指数
17论文数
274被引数
收录论文 6
发表时间
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Measuring the multilayer silicon based microstructure using differential reflectance spectroscopy
err2021-01-19
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errOAAI
errHuo, Shuchun; Wang, Hao; Hu, Chunguang; Yao, Chengyuan; Shen, Wanfu; Hu, Xiaodong; Hu, Xiaotang
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