Subiao Bian - Publications, H-index & Citations

Subiao Bian

china jiliang university

8H指数

28论文数

180被引数

收录论文 10

发表时间

Non-destructive measurement for ultra-thin subsurface damage layer of single-crystal diamond substrates in ultra-precision machining based on ellipsometry assisted by white light interferometry 基于椭圆光度法辅助白光干涉法的单晶金刚石衬底超精密加工中非破坏性测量超薄亚表面损伤层

Measurement

IF5.6

2026-09-11

PREAI

Ziqing Li; Subiao Bian; Han Tong; Jing Lu; Xipeng Xu; Changcai Cui; Hui Huang

Contrasting Transmission and Backreflection Configurations in Polarimetric Imaging 偏振成像中传输和背反射配置的对比

POLARIZED LIGHT AND OPTICAL ANGULAR MOMENTUM FOR BIOMEDICAL DIAGNOSTICS 2026

IF0

2026-01-01

PREAI

Arteaga, Oriol; Pardo, Iago; Ares, Miguel; Chen, Shuang; Camblor, Lourdes; Bian, Subiao; Pascual, Esther; Gomis-Bresco, Jordi; Canillas, Adolf; Bosch, Salvador

Quantitative characterization of roughness and polarization on very rough surfaces using spectroscopic ellipsometry 使用光谱椭偏仪定量表征非常粗糙的表面上的粗糙度和偏振

MEASUREMENT

IF5.6

2025-06-30

PREAI

Bian, Subiao; Cui, Changcai; Arteaga, Oriol

A simple pathway for complete polarization vision

SCIENTIFIC REPORTS

IF3.9

2025-03-14

OAAI

Bian, Subiao; Arteaga, Oriol

Dielectric function and thermo-optic coefficients of silicon-doped GaN substrates at elevated temperature from 298 K to 873 K in the UV-Vis-NIR spectrum

SCIENTIFIC REPORTS

IF3.9

2025-02-03

OAAI

Bian, Subiao; Chen, Xi; Cui, Changcai

Clear imaging method for underwater targets based on the second Lorentz depolarization index

ALEXANDRIA ENGINEERING JOURNAL

IF6.8

2024-10-01

OAAI

Chen, Shuang; Xu, Xipeng; Bian, Subiao; Li, Huihui; Cui, Changcai

Full-field measurement of residual stress in single-crystal diamond substrates based on Mueller matrix microscopy 基于Mueller矩阵显微镜的单晶金刚石衬底残余应力的全场测量

MEASUREMENT

IF5.6

2024-07-01

PREAI

Li, Ziqing; Cui, Changcai; Arteaga, Oriol; Bian, Subiao; Tong, Han; Lu, Jing; Xu, Xipeng

Spatial dispersion in silicon

PHYSICAL REVIEW B

IF3.7

2024-01-03

PREAI

Bian, Subiao; Ossikovski, Razvigor; Canillas, Adolf; Jellison, Gerald; Arteaga, Oriol

Spectroscopic ellipsometry of very rough surfaces

OPTICS EXPRESS

IF3.3

2023-05-26

OAAI

Bian, Subiao; Arteaga, Oriol

A review of characterization of perovskite film in solar cells by spectroscopic ellipsometry 太阳电池中钙钛矿薄膜的椭偏光谱表征

SOLAR ENERGY

IF6.6

2020-12-01

PREAI

Li, Huihui; Cui, Changcai; Xu, Xipeng; Bian, Subiao; Ngaojampa, Chanisorn; Ruankham, Pipat; Jaroenjittchai, Atchara Punya

研究方向