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S

Stefano Marchesini

united states department of energy (doe)
H指数:51
被引数:1.4万

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Combined speckle- and propagation-based single shot two-dimensional phase retrieval method
OPTICS EXPRESS
IF3.3
2024-12-111
OA
Leong, Andrewf. t.; Hodge, DANIELS.; Kelinkurzer-ogul, Kelin; Marchesini, Stefano; Pandolfi, Silvia; Liu, Yanwei; Barber, John l.; Li, Kenan; Sakdinawat, Anne; Galtier, Eric c.; Nagler, Bob; Lee, Hae ja; Cunningham, Eric f.; Carver, Thomas e.; Aluie, Hussein; Shang, Jessica k.; Bolme, Cynthia a.; Ramos, Kyle j.; Khaghani, Dimitry; Sandberg, Richard l.; Montgomery, David s.; Kozlowski, PAWELM.; Gleason, Arianna e.
Sizes of pure and doped helium droplets from single shot x-ray imaging

单次x射线成像的纯氦和掺杂氦液滴的尺寸

JOURNAL OF CHEMICAL PHYSICS
IF3.1
2022-01-314
OA
Tanyag, Rico Mayro P.; Bacellar, Camila; Pang, Weiwu; Bernando, Charles; Gomez, Luis F.; Jones, Curtis F.; Ferguson, Ken R.; Kwok, Justin; Anielski, Denis; Belkacem, Ali; Boll, Rebecca; Bozek, John; Carron, Sebastian; Chen, Gang; Delmas, Tjark; Englert, Lars; Epp, Sascha W.; Erk, Benjamin; Foucar, Lutz; Hartmann, Robert; Hexemer, Alexander; Huth, Martin; Leone, Stephen R.; Ma, Jonathan H.; Marchesini, Stefano; Neumark, Daniel M.; Poon, Billy K.; Prell, James; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Seifrid, Martin; Swiggers, Michele; Ullrich, Joachim; Weise, Fabian; Zwart, Petrus; Bostedt, Christoph; Gessner, Oliver; Vilesov, Andrey F.
An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials
SCIENCE ADVANCES
IF12.5
2020-12-1848
OAAI
Shapiro, David A.; Babin, Sergey; Celestre, Richard S.; Chao, Weilun; Conley, Raymond P.; Denes, Peter; Enders, Bjoern; Enfedaque, Pablo; James, Susan; Joseph, John M.; Krishnan, Harinarayan; Marchesini, Stefano; Muriki, Krishna; Nowrouzi, Kasra; Oh, Sharon R.; Padmore, Howard; Warwick, Tony; Yang, Lee; Yashchuk, Valeriy V.; Yu, Young-Sang; Zhao, Jiangtao
Three-dimensional localization of nanoscale battery reactions using soft X-ray tomography

使用软x射线断层扫描对纳米级电池反应进行三维定位

NATURE COMMUNICATIONS
IF15.7
2018-03-02111
OAAI
Yu, Young-Sang; Farmand, Maryam; Kim, Chunjoong; Liu, Yijin; Grey, Clare P.; Strobridge, Fiona C.; Tyliszczak, Tolek; Celestre, Rich; Denes, Peter; Joseph, John; Krishnan, Harinarayan; Maia, Filipe R. N. C.; Kilcoyne, A. L. David; Marchesini, Stefano; Leite, Talita Perciano Costa; Warwick, Tony; Padmore, Howard; Cabana, Jordi; Shapiro, David A.
Near-edge X-ray refraction fine structure microscopy
APPLIED PHYSICS LETTERS
IF3.6
2017-02-0626
OAAI
Farmand, Maryam; Celestre, Richard; Denes, Peter; Kilcoyne, A. L. David; Marchesini, Stefano; Padmore, Howard; Tyliszczak, Tolek; Warwick, Tony; Shi, Xiaowen; Lee, James; Yu, Young-Sang; Cabana, Jordi; Joseph, John; Krishnan, Harinarayan; Perciano, Talita; Maia, Filipe R. N. C.; Shapiro, David A.
Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO4

LixFePO4中纳米级化学相分布和断裂对晶体尺寸的依赖性

NANO LETTERS
IF9.1
2015-06-18106
OAAI
Yu, Young-Sang; Kim, Chunjoong; Shapiro, David A.; Farmand, Maryam; Qian, Danna; Tyliszczak, Tolek; Kilcoyne, A. L. David; Celestre, Rich; Marchesini, Stefano; Joseph, John; Denes, Peter; Warwick, Tony; Strobridge, Fiona C.; Grey, Clare P.; Padmore, Howard; Meng, Ying Shirley; Kostecki, Robert; Cabana, Jordi
Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
OPTICS EXPRESS
IF3.3
2013-11-1417
OAAI
Park, Hyung Joo; Loh, N. Duane; Sierra, Raymond G.; Hampton, Christina Y.; Starodub, Dmitri; Martin, Andrew V.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Lomb, Lukas; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Guenter; Holl, Peter; Pedersoli, Emanuele; Liang, Mengning; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsma, Heinz; Maia, Filipe R. N. C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; Tobias, Herbert J.; Farquar, George R.; Benner, W. Henry; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Frank, Matthias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.; Elser, Veit
Sensing the wavefront of x-ray free-electron lasers using aerosol spheres
OPTICS EXPRESS
IF3.3
2013-05-1329
OAAI
Loh, N. Duane; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Guenter; Holl, Peter; Pedersoli, Emanuele; Liang, Mengning; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsma, Heinz; Maia, Filipe R. N. C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Benner, W. Henry; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Frank, Matthias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.
Noise-robust coherent diffractive imaging with a single diffraction pattern
OPTICS EXPRESS
IF3.3
2012-07-0978
OAAI
Martin, A. V.; Wang, F.; Loh, N. D.; Ekeberg, T.; Maia, F. R. N. C.; Hantke, M.; van der Schot, G.; Hampton, C. Y.; Sierra, R. G.; Aquila, A.; Bajt, S.; Barthelmess, M.; Bostedt, C.; Bozek, J. D.; Coppola, N.; Epp, S. W.; Erk, B.; Fleckenstein, H.; Foucar, L.; Frank, M.; Graafsma, H.; Gumprecht, L.; Hartmann, A.; Hartmann, R.; Hauser, G.; Hirsemann, H.; Holl, P.; Kassemeyer, S.; Kimmel, N.; Liang, M.; Lomb, L.; Marchesini, S.; Nass, K.; Pedersoli, E.; Reich, C.; Rolles, D.; Rudek, B.; Rudenko, A.; Schulz, J.; Shoeman, R. L.; Soltau, H.; Starodub, D.; Steinbrener, J.; Stellato, F.; Strueder, L.; Ullrich, J.; Weidenspointner, G.; White, T. A.; Wunderer, C. B.; Barty, A.; Schlichting, I.; Bogan, M. J.; Chapman, H. N.

研究方向

暂未获取到该数据
H
Henry N. Chapman
H 指数:89论文数:693被引数:3.4万
D
David A. Shapiro
H 指数:73论文数:395被引数:2.0万
A
Anton Barty
H 指数:78论文数:396被引数:2.4万
S
S. Bajt
H 指数:61论文数:505被引数:1.7万
M
Michael J. Bogan
H 指数:40论文数:119被引数:1.1万
F
Filipe R. N. C. Maia
H 指数:46论文数:154被引数:1.1万
M
Matthias Frank
H 指数:49论文数:245被引数:1.2万
J
John C. H. Spence
H 指数:56论文数:325被引数:1.6万
B
Benedikt Rudek
H 指数:38论文数:107被引数:8,169
S
Sascha W. Epp
H 指数:42论文数:109被引数:9,581