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J

Jinda Yan

soochow university

3H指数
6论文数
45被引数
收录论文 4
发表时间
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Multi-scale guidance diffusion network for wafer map defect recognition多尺度引导扩散网络用于晶圆地图缺陷识别
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2025-04-01
err0
PREAI
errLong, ZX; Yan, JD; Piao, MH
err分享
err收藏
Position-Aware Self-Supervised Learning for Wafer Map Defect Pattern Recognition位置感知自监督学习用于晶圆地图缺陷模式识别
errIEEE Transactions on Instrumentation and Measurement
IF5.9
err2025-01-01
err0
PREAI
errWei Yuan; Jinda Yan; Minghao Piao
err分享
err收藏
Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2024-07-01
err1
PREAI
errSheng, Yi; Yan, Jinda; Piao, Minghao
err分享
err收藏
Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification
errACM TRANSACTIONS ON KNOWLEDGE DISCOVERY FROM DATA
IF4.8
err2024-02-13
err1
PREAI
errPiao, Minghao; Sheng, Yi; Yan, Jinda; Jin, Cheng Hao
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
M
Minghao Piao
H 指数: 13 · 论文数: 61
W
Wei Yuan
H 指数: 12 · 论文数: 82
C
Cheng Jin
H 指数: 11 · 论文数: 57
Y
Yi Sheng
H 指数: 5 · 论文数: 14
Z
Zuxiang Long
H 指数: 2 · 论文数: 4
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