Kiyoshi Takamasu - Publications, H-index & Citations

Kiyoshi Takamasu

University of Tokyo

22H指数

344论文数

2.2K被引数

收录论文 47

发表时间

A lightweight and multi-scale model for MLCC appearance defect detection 一种轻量级和多尺度模型用于MLCC外观缺陷检测

Optics & Laser Technology

IF0

2025-11-01

PREAI

Junwei Zheng; Xiuhua Cao; Dawei Zhang; Kiyoshi Takamasu; Meiyun Chen

Efficient Semi-Supervised Segmentation Network for X-Ray Metrology of Solder Joint Voids X射线焊点气孔测量的高效半监督分割网络

IEEE Transactions on Instrumentation and Measurement

IF5.9

2025-01-01

PREAI

Qicheng Lin; Kiyoshi Takamasu; Meiyun Chen

Defect detection of MicroLED with low distinction based on deep learning

OPTICS AND LASERS IN ENGINEERING

IF3.7

2024-02-01

PREAI

Chen, Meiyun; Chen, Jinbiao; Li, Cheng; Wang, Qianxue; Takamasu, Kiyoshi

Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC 基于深度学习的MLCC多品种外观缺陷检测模型

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2024-01-01

PREAI

Du, Minjie; Chen, Meiyun; Cao, Xiuhua; Takamasu, Kiyoshi

An Optical Lens Defect Detection Method for Micro Vision Based on WGSO-YOLO 基于WGSO-YOLO的显微视觉光学镜片缺陷检测方法

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2024-01-01

PREAI

Lin, Qicheng; Takamasu, Kiyoshi; Chen, Meiyun

Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC 基于机器视觉的MLCC轻量级多尺度缺陷自动分割网络

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2024-01-01

PREAI

He, Junjie; Cao, Xiuhua; Takamasu, Kiyoshi; Chen, Meiyun

SCPNet-based correction of distorted multi-spots for three-dimensional surface measurement of metal cylindrical shaft parts

OPTICS EXPRESS

IF3.3

2023-06-26

OAAI

Huang, Xinyang; Chen, Meiyun; Wu, Heng; Kong, Deqing; Takamasu, Kiyoshi

Deep learning-based weak micro-defect detection on an optical lens surface with micro vision

OPTICS EXPRESS

IF3.3

2023-01-31

OAAI

Yang, Wennuo; Chen, Meiyun; Wu, Heng; Lin, Zhengyang; Kong, Deqing; Xie, Shengli; Takamasu, Kiyoshi

Numerical analysis on high resolution optical measurement method with long working distance objective for in-line inspection of micro-structured surface

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2021-01-01

PREAI

Kume, Hiromasa; Michihata, Masaki; Takamasu, Kiyoshi; Takahashi, Satoru

Three-dimensional surface profile measurement of a cylindrical surface using a multi-beam angle sensor

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2020-03-01

PREAI

Chen, Meiyun; Xie, Shengli; Wu, Heng; Takahashi, Satoru; Takamasu, Kiyoshi

Smart optical measurement probe for autonomously detecting nano-defects on bare semiconductor wafer surface: Verification of proposed concept 用于自主检测裸半导体晶片表面上纳米缺陷的智能光学测量探头: 对拟议概念的验证

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2020-01-01

PREAI

Tachibana, Kazuki; Michihata, Masaki; Takamasu, Kiyoshi; Takahashi, Satoru

Advanced generation of functional dual-periodic microstructured surface based on optical in-process measurement

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2020-01-01

PREAI

Takahashi, Satoru; Masui, Shuzo; Michihata, Masaki; Takamasu, Kiyoshi

Absolute distance measurement based on spectral interferometer using the effect of the FSR of a Fabry-Perot etalon 基于fabry-perot标准具的FSR效应的基于光谱干涉仪的绝对距离测量

OPTICS AND LASERS IN ENGINEERING

IF3.7

2019-12-01

PREAI

Chen, Meiyun; Xie, Shengli; Zhou, Guoxu; Wei, Dong; Wu, Heng; Takahashi, Satoru; Matsumoto, Hirokazu; Takamasu, Kiyoshi

Fabrication of nano/micro dual-periodic structures by multi-beam evanescent wave interference lithography using spatial beats

OPTICS EXPRESS

IF3.3

2019-10-16

OAAI

Masui, Shuzo; Torii, Yuki; Michihata, Masaki; Takamasu, Kiyoshi; Takahashi, Satoru

Quantitative depth evaluation of microgrooves on polymer material beyond the diffraction limit 超过衍射极限的聚合物材料微槽的定量深度评估

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2019-09-01

PREAI

Ye, Shiwei; Takahashi, Satoru; Michihata, Masaki; Takamasu, Kiyoshi; Hansen, Hans Norgaard; Calaon, Matteo

Spectroscopic interferometer with a large length range by rotating diffraction grating

OPTICS EXPRESS

IF3.3

2019-04-01

OAAI

Chen, Meiyun; Xie, Shengli; Wu, Heng; Takahashi, Satoru; Matsumoto, Hirokazu; Takamasu, Kiyoshi

Comparative evaluation of estimation of hole plate measurement uncertainty via Monte Carlo simulation

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2019-03-01

PREAI

Miura, Yuka; Nakanishi, Shoichi; Higuchi, Eiichi; Takamasu, Kiyoshi; Abe, Makoto; Sato, Osamu

A new measurement method to simultaneously determine group refractive index and thickness of a sample using low-coherence tandem interferometry

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2019-01-01

PREAI

Winarno, Agustinus; Takahashi, Satoru; Matsumoto, Hirokazu; Takamasu, Kiyoshi

In-process measurement for cure depth control of nano stereolithography using evanescent light

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2019-01-01

PREAI

Takahashi, S.; Kong, D.; Michihata, M.; Takamasu, K.

Comparative evaluation of estimation of step gauge measurement uncertainty via Monte Carlo simulation

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2019-01-01

PREAI

Miura, Yuka; Nakanishi, Shoichi; Higuchi, Eiichi; Takamasu, Kiyoshi; Abe, Makoto; Sato, Osamu

研究方向