James Moyne - Publications, H-index & Citations

James Moyne

university of michigan system

29H指数

161论文数

4.8K被引数

收录论文 11

发表时间

Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems

IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING

IF6.4

2024-04-01

OAAI

Balta, Efe C.; Pease, Michael; Moyne, James; Barton, Kira; Tilbury, Dawn M.

A digital twin framework for prognostics and health management 用于预测和健康管理的数字孪生框架

COMPUTERS IN INDUSTRY

IF9.1

2023-09-01

PREAI

Toothman, Maxwell; Braun, Birgit; Bury, Scott J.; Moyne, James; Tilbury, Dawn M.; Ye, Yixin; Barton, Kira

Opportunities and Challenges to Integrate Artificial Intelligence Into Manufacturing Systems: Thoughts From a Panel Discussion 将人工智能集成到制造系统中的机遇与挑战: 小组讨论的想法

IEEE ROBOTICS & AUTOMATION MAGAZINE

IF7.1

2023-06-01

PREAI

Kovalenko, Ilya; Barton, Kira; Moyne, James; Tilbury, Dawn M.

Overcoming Challenges Associated with Developing Industrial Prognostics and Health Management Solutions

SENSORS

IF3.5

2023-04-15

OAAI

Toothman, Maxwell; Braun, Birgit; Bury, Scott J.; Moyne, James; Tilbury, Dawn M.; Ye, Yixin; Barton, Kira

Toward an Automated Learning Control Architecture for Cyber-Physical Manufacturing Systems 走向网络物理制造系统的自动学习控制体系结构

IEEE ACCESS

IF3.6

2022-01-01

OAAI

Kovalenko, Ilya; Moyne, James; Bi, Mingjie; Balta, Efe C.; Ma, Wenyuan; Qamsane, Yassine; Zhu, Xiao; Mao, Z. Morley; Tilbury, Dawn M.; Barton, Kira

A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Qamsane, Yassine; Moyne, James; Toothman, Maxwell; Kovalenko, Ilya; Balta, Efe C.; Faris, John; Tilbury, Dawn M.; Barton, Kira

A Requirements Driven Digital Twin Framework: Specification and Opportunities 需求驱动的数字孪生框架: 规范和机会

IEEE ACCESS

IF3.6

2020-01-01

121

OAAI

Moyne, James; Qamsane, Yassine; Balta, Efe C.; Kovalenko, Ilya; Faris, John; Barton, Kira; Tilbury, Dawn M.

A Hierarchical Incentive Arbitration Scheme for Coordinated PEV Charging Stations

IEEE TRANSACTIONS ON SMART GRID

IF9.8

2015-07-01

PREAI

Anand, Dhananjay M.; de Salis, Rupert Tull; Cheng, Yijie; Moyne, James; Tilbury, Dawn M.

Virtual metrology and feedback control for semiconductor manufacturing processes using recursive partial least squares 使用递归偏最小二乘法对半导体制造过程进行虚拟计量和反馈控制

JOURNAL OF PROCESS CONTROL

IF3.9

2008-12-01

133

PREAI

Khan, Aftab A.; Moyne, J. R.; Tilbury, D. M.

The emergence of industrial control networks for manufacturing control, diagnostics, and safety data

PROCEEDINGS OF THE IEEE

IF25.9

2007-01-01

210

PREAI

Moyne, James R.; Tilbury, Dawn M.

Network architecture and communication modules for guaranteeing acceptable control and communication performance for networked multi-agent systems

IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS

IF9.9

2006-02-01

PREAI

Lian, Feng-Li; Yook, John K.; Tilbury, Dawn M.; Moyne, James

研究方向