.png){kind=icon}
返回
A stochastic encoder using point defects in two-dimensional materials
.png){kind=icon}
OA
AI
DOI：10.1038/s41467-024-54283-1.png)
.png){kind=icon}
.png){kind=icon}
分享.png){kind=icon}
收藏
摘要
En 中文
While defects are undesirable for the reliability of electronic devices, particularly in scaled microelectronics, they have proven beneficial in numerous quantum and energy-harvesting applications. However, their potential for new computational paradigms, such as neuromorphic and brain-inspired computing, remains largely untapped. In this study, we harness defects in aggressively scaled field-effect transistors based on two-dimensional semiconductors to accelerate a stochastic inference engine that offers remarkable noise resilience. We use atomistic imaging, density functional theory calculations, device modeling, and low-temperature transport experiments to offer comprehensive insight into point defects in WSe2 FETs and their impact on random telegraph noise. We then use random telegraph noise to construct a stochastic encoder and demonstrate enhanced inference accuracy for noise-inflicted medical-MNIST images compared to a deterministic encoder, utilizing a pre-trained spiking neural network. Our investigation underscores the importance of leveraging intrinsic point defects in 2D materials as opportunities for neuromorphic computing.
Keyword:
NOISE
DEVICES
WSE2
AI总结
对已上传原文的论文进行重点信息的提取，主要内容包括：简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。
期刊
IF:
15.7
论文数:
9.4W
被引数:
91.2W
机构
引用论文
分享收藏Random-telegraph-noise-enabled true random number generator for hardware security.png)
SCIENTIFIC REPORTSOAAI
SCIENTIFIC REPORTSIF3.9
OAAI分享收藏Is there a common genetic background for pre-eclampsia and recurrent spontaneous abortions?The Lancet
The LancetIF0
PREAI
分享收藏Altered synaptic physiology and reduced susceptibility to kainate-induced seizures in GluR6-deficient miceNature
NatureIF0
PREAI
分享收藏Time-dependent defect spectroscopy for characterization of border traps in metal-oxide-semiconductor transistorsPHYSICAL REVIEW B
PHYSICAL REVIEW BIF3.7
PREAI
分享收藏
Variability Mitigation in Nanometer CMOS Integrated Systems: A Survey of Techniques From Circuits to SoftwarePROCEEDINGS OF THE IEEE
PROCEEDINGS OF THE IEEEIF25.9
PREAI
分享收藏
查看更多内容