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Charge gradient microscopy
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DOI：10.1073/pnas.1324178111.png)
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摘要
En 中文
Here we present a simple and fast method to reliably image polarization charges using charge gradient microscopy (CGM). We collected the current from the grounded CGM probe while scanning a periodically poled lithium niobate single crystal and single-crystal LiTaO3 thin film on the Cr electrode. We observed current signals at the domains and domain walls originating from the displacement current and the relocation or removal of surface charges, which enabled us to visualize the ferroelectric domains at a scan frequency above 78 Hz over 10 mu m. We envision that CGM can be used in high-speed ferroelectric domain imaging and piezoelectric energy-harvesting devices.
Keyword:
screen charge
atomic force microscopy
piezoresponse
charge scraping
期刊
P
IF:
9.1
论文数:
10.8W
被引数:
87.0W
机构
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