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Corrections to “Semi-Classical Monte Carlo Simulation of Quantum Confinement Effects in Si Nanosheet and Fin FETs in Industry Standard Orientation”

delete2026-05-27
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PRE
AI
U
Uiho Lee
J
J. Kim
B
Byoung Hak Hong
W
Wookhyun Kwon
B
Branch T. Archer
L
Leonard F. Register
S
Sanjay K. Banerjee
J
Jiwon Chang
DOI:10.1109/LED.2026.3682574delete
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Abstract

Abstract

En 中文
Presents corrections to the paper, (“Semi-Classical Monte Carlo Simulation of Quantum Confinement Effects in Si Nanosheet and Fin FETs in Industry Standard Orientation”).
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Journal

IEEE Electron Device Letters cover
IEEE Electron Device Letters
IF:
4.5
Papers:
614
Citations:
2.3W

Organization

T
the university of texas
Scholars:
479
Papers: 154
Citations: 0
S
samsung electronics
Scholars:
449
Papers: 158
Citations: 0
Y
Yonsei University
Scholars:
4.7W
Papers: 4.5W
Citations: 5.2W
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