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Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
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DOI：10.1080/00207543.2010.543938.png)
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Accurate cycle time is an essential planning basis required for many production applications, especially on due date commitments, performance metrics analysing, capacity planning, and scheduling. The re-entrant final testing process is the final stage of the complicated semiconductor manufacturing process. To enhance the ability of quick responses and to achieve better on-time delivery in final testing factories, it is essential to develop an accurate cycle time estimation method. In this paper, we provide a statistical approach to calculate the cycle time for multi-layer semiconductor final testing involving the sum of multiple Weibull-distributed waiting times. In addition, percentiles of the cycle time are obtained which are useful to industrial practitioners for due date commitments satisfying the targeted on-time delivery rate. To demonstrate the applicability of the proposed cycle time estimation model, a real example in a semiconductor final testing factory which is located on the Science-based Industrial Park in Hsinchu, Taiwan, is presented.
Keyword:
cycle time estimation
semiconductor final testing
Weibull distribution
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7.3
论文数:
1.1W
被引数:
3.7W
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