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High-resolution electron microscopy: From imaging toward measuring

delete2002-08-01
delete15
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OA
AI
S
Sandra Van Aert
D
den Dekker, AJ
A
A. van den Bos
D
D. Van Dyck
DOI:10.1109/TIM.2002.802250delete
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摘要

摘要

En 中文
High-resolution electron microscopy is discussed as a measuring, rather than an imaging, technique. It is shown that the interpretation of the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.
Keyword:
parameter estimation
precision
quantitative model-based high-resolution electron microscopy
statistical experimental design

期刊

IEEE Transactions on Instrumentation and Measurement 封面图
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
论文数:
2.0W
被引数:
5.8W

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