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Image correction for atomic force microscopy images with functionalized tips
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DOI：10.1103/PhysRevB.89.205407.png)
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摘要
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It has been demonstrated that atomic force microscopy imaging with CO-functionalizedtips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
Keyword:
SINGLE-MOLECULE
REAL-SPACE
RESOLUTION
IDENTIFICATION
SPECTROSCOPY
GRAPHENE
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期刊
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3.7
论文数:
15.4W
被引数:
41.0W
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Three-dimensional imaging of short-range chemical forces with picometre resolution.png)
NATURE NANOTECHNOLOGY
NATURE NANOTECHNOLOGYIF34.9
PREAI
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