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Microstructure segmentation using multi-angle polarized light microscopy
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DOI：10.1016/j.matchar.2022.112197.png)
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摘要
En 中文
Grain size and shape are important microstructure attributes affected by material processing and contributing to material properties. We develop automated tools to segment multi-angle polarized light microscopy (PLM) im-ages of low symmetry metals such that statistics of grain size and shape can be automatically measured. To demonstrate the tools, we apply PLM to alpha???titanium, an hcp crystal structure metal with axisymmetric optical properties and a good candidate for the technique. The segmentation routine uses a region growing algorithm based on similarity of the intensity variance of neighboring pixels for three sample rotations, and grain dilation that checks the proximity of pixels to grain boundaries and triple points. For relatively fine-grained Ti, the segmentation is accurate for 97.5% of the grain boundaries in the microstructure when compared to EBSD re-sults, and the accuracy is expected to improve for larger grained materials. The technique does a good job of defining twin features in deformed materials that, due to twin size and optical limitations, exhibit substantial intensity gradients making segmentation challenging.
Keyword:
Titanium
Segmentation
Polarized light microscopy
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期刊
IF:
5.5
论文数:
1.1W
被引数:
3.4W
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引用论文
A rationale for the strong dependence of mechanical twinning on grain size.png)
SCRIPTA MATERIALIA
SCRIPTA MATERIALIAIF5.6
PREAI
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