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Microscopy and Microanalysis 封面图
Microscopy and Microanalysis
IF:
3
论文数:
2.5K
被引数:
6.2K

机构

S
Stanford University
学者数:
1.1K
论文数: 416
被引数: 0
L
Lawrence Berkeley National Laboratory
学者数:
271
论文数: 97
被引数: 0
引用论文

引用论文

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns
err2022-12-14
err17
errOAAI
errMunshi, Joydeep; Rakowski, Alexander; Savitzky, Benjamin H.; Zeltmann, Steven E.; Ciston, Jim; Henderson, Matthew; Cholia, Shreyas; Minor, Andrew M.; Chan, Maria K. Y.; Ophus, Colin
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The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
err2020-07-01
err0
errOAAI
errElliot Padgett; Megan E. Holtz; Paul Cueva; Yu-Tsun Shao; Eric Langenberg; Darrell G. Schlom; David A. Muller
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err收藏
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
err2017-05-01
err0
errOAAI
errThomas C. Pekin; Christoph Gammer; Jim Ciston; Andrew M. Minor; Colin Ophus
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err收藏