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S

Stephanie M. Ribet

Lawrence Berkeley National Laboratory

13H指数
155论文数
465被引数
收录论文 62
发表时间
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Advances in Phase Contrast 4D-STEM Tomography of Thick Biological Specimens厚生物样品相位衬度4D-STEM断层成像研究进展
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errBerk Küçükoğlu; Massimo Kube; Wen-Lu Chung; Georgios Varnavides; Max Leo Leidl; Julika Radecke; Daniel Stähli; Stephanie Ribet; Carsten Sachse; Colin Ophus; Knut Müller-Caspary; Henning Stahlberg
err分享
err收藏
Streaming Parallax Ptychography for Dose-Efficient Diffractive Imaging用于低剂量衍射成像的流式视差ptychography
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errGeorgios Varnavides; Willem P M de Kleijne; Stephanie M Ribet; Peter Ercius; Dieter Weber; Alexander Clausen; Toma Susi; Clemens Mangler
err分享
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Sparse-view Multimodal Electron Tomography Using Implicit Neural Representations基于隐式神经表示的稀疏视图多模态电子断层成像
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errCedric Lim; Arthur R C McCray; Corneel Casert; William Milsaps; Stephanie M Ribet; Colin Ophus
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Application of Multi-Angle Precession Electron Diffraction to Electric Field Measurement Using Differential Phase Contrast多角度摇摆电子衍射在差分相位衬度电场测量中的应用
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errEdwin Supple; Kris A Bertness; Karen C Bustillo; Rohan Dhall; Stephanie M Ribet; Alexana Roshko
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Mapping Point Defect Landscapes in FCC Metals Using 4D-STEM Diffuse Scattering Signatures使用4D-STEM漫散射特征映射面心立方金属中的点缺陷景观
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errAlexandre R Bordas; Madelyn I Payne; Stephanie M Ribet; Julia I Deitz; Andrew M Minor
err分享
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Deep Priors and Self-Supervised Learning for Electron Ptychography and Beyond深度先验和自监督学习用于电子 Ptychography 及其应用
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errArthur R C McCray; Stephanie Ribet; Georgios Varnavides; Colin Ophus
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5D STEM for 6D Crystallography in Disordered Materials5D STEM技术在无序材料6D晶体学中的应用
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errCorrie Barnes; Stephanie M Ribet; Arthur R C McCray; Cedric Lim; Corneel Casert; Colin Ophus
err分享
err收藏
How Does Charge Injection Reorder the Mesoscale Microstructure of Mixed Ionic–Electronic Conducting Polymers?电荷注入如何重排混合离子-电子导电聚合物的介观微观结构？
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errYael Tsarfati; Nicholas Marchese; Karen C Bustillo; Stephanie M Ribet; Karina Masalkovaitė; Junyan Li; Adam Marks; Rajiv Giridharagopal; David Ginger; Colin Ophus; Andrew M Minor; Alberto Salleo
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Integrating a Supercomputing Facility into the Electron Microscopy Pipeline for On-the-fly 4D-STEM Reconstructions将超级计算设施集成到电子显微镜工作流中，以实现实时4D-STEM重构
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errStephanie M Ribet; Sam Welborn; Bjoern Enders; Chris Harris; Georgios Varnavides; Peter Ercius
err分享
err收藏
Every Electron Counts: Dose-Efficient Nanobeam 4D-STEM and Spectroscopy每个电子都至关重要：剂量高效的纳米束4D-STEM与光谱学
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errStephanie M Ribet; Sanya Gowda; Kovidh Singh; Niko Vlahakis; Yael Tsarfati; Corneel Casert; Peter D Dahlberg; Colin Ophus; Rohan Dhall; Karen C Bustillo
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5D-STEM Mapping of Crystalline Orientation and Assembly Dynamics of Gold Nanostructures in Liquid Phase5D-STEM对液相中金纳米结构的结晶取向及组装动态的映射
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errParivash Moradifar; Tim van Driel; Amy S McKeown-Green; Alan Dai; Niccolò Bottauscio; Stephanie M Ribet; Andrew Barnum; Colin Ophus; Jennifer Dionne
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Integrating Microscopy, Large Language Models, and High Performance Computing集成显微技术、大型语言模型和高性能计算
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errPeter Ercius; Sam Welborn; Morgan K Wall; Alexander J Pattison; Chris Harris; Stephanie M Ribet; Bjoern Enders
err分享
err收藏
Revealing the 3D Dislocation Core Structure in a Refractory Medium Entropy Alloy Using Multislice Electron Ptychography利用多片电子像衬术揭示难熔中熵合金中的3D位错核心结构
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errXiaoyu Chen; Wenqing Wang; David H Cook; Haozhi Sha; Stephanie M Ribet; Velimir R Radmilovic; Robert O Ritchie; Mark Asta; Satish I Rao; Andrew M Minor
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Alternating Bias Assisted Annealing Influences Amorphous Alumina Structure in Superconducting Quantum Resonators交替偏压辅助退火影响超导量子谐振器中非晶氧化铝结构
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errNicholas Hagopian; Vito Iaia; Emily Joseph; Stephanie Ribet; Sean O’Kelley; Sayan Patra; Loren Alegria; Keith Ray; Yaniv Rosen; Paul M Voyles
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Nanobeam 4DSTEM for Mapping Nanoscale Structural Transitions in Complex Oxide Membranes纳米光束4D-STEM技术用于映射复杂氧化物膜中的纳米尺度结构转变
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errHudson A Shih; Huijue Liu; Izoah L Snowden; Stephanie M Ribet; Rohan Dhall; Yayoi Takamura; Seung Sae Hong
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err收藏
High-Throughput Automation of STEM Defect Analysis in WSe2高吞吐量自动化STEM缺陷分析在WSe2中
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errCaitlyn Obrero; William Millsaps; Anh Tuan Hoang; Dasol Yoon; Stephanie M Ribet; Eric Pop; Andrew J Mannix; Colin Ophus
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Optimizing Strain Mapping using Nanobeam Diffraction in 4DSTEM使用纳米束衍射优化4DSTEM应变映射
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errMiti Shah; Arthur R C McCray; Stephanie Ribet; Nicholas Marchese; Karen Ehrhardt; Henry Bell; Sangjoon Lee; Corrie Barnes; Colin Ophus
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Building the Metrology of the Quantum Future: Engineering, Design, and Simulation of an All-Superconducting Electron Microscope at Berkeley Lab构建量子未来的计量学：伯克利实验室全超导电子显微镜的工程、设计与仿真
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errJim Ciston; Tengming Shen; Lucas Brouwer; Yufan Yan; Ryan Norris; Ray Hafalia; Li Wang; Stephanie Ribet; Qing Ji; Marian Mankos; Alexander Stibor; Peter Ercius; Ross Schlueter; Andrew Minor; Peter Denes
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err收藏
Correction: The ABCs of phase retrieval: Connecting the acronyms of scanning transmission electron microscopy更正：相位恢复的ABC：连接扫描透射电子显微镜的缩略词
errMRS Bulletin
IF4.9
err2026-07-15
err0
errOAAI
errGeorgios Varnavides; Willem P. M. de Kleijne; Stephanie M. Ribet
err分享
err收藏
The ABCs of phase retrieval: Connecting the acronyms of scanning transmission electron microscopy相检索基础：连接扫描透射电子显微镜的缩写
errMRS Bulletin
IF4.9
err2026-06-23
err0
errOAAI
errGeorgios Varnavides; Willem P. M. de Kleijne; Stephanie M. Ribet
err分享
err收藏

研究方向

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