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Parametrically coupled multiharmonic force imaging
DOI:10.1063/1.2940304.png)
摘要
En 中文
We report use of nonlinear tip-sample interactions to parametrically convert the frequency components of periodic tip-sample interaction forces to frequencies where they can be resonantly detected. One flexural mode of a cantilever is used for tapping-mode imaging and another flexural mode is used for detection of forces converted in presence of an externally injected mechanical oscillation at the difference frequency of the detecting mode and a harmonic of the tapping mode. Material contrast in attractive and repulsive regimes are demonstrated on samples with polymethyl methacrylate patterns and with deoxyribonucleic acid strands on silicon. (C) 2008 American Institute of Physics.
Keyword:
ENERGY-DISSIPATION
MICROSCOPY
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期刊
IF:
3.6
论文数:
10.4W
被引数:
18.3W
机构
引用论文
Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
PHYSICAL REVIEW B
IF3.7

