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DOI：10.1109/JPROC.2020.2979196.png)
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摘要
En 中文
Since its inception, the semiconductor industry has used the physical dimension (the gate length) as a means to gauge its continuous advancement. This metric is all but obsolete today. In this month's opinion piece, the authors examine historical trends and analyze how device technology provides for benefits at the system level, and propose a new density metric. This density metric aims to capture the essential characteristics of semiconductor technologies in a holistic way and to gauge the advances of future generations.
AI总结
对已上传原文的论文进行重点信息的提取，主要内容包括：简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。
