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Spectral contrast imaging microscopy

delete2011-08-19
delete14
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OA
AI
S
Sergey Alexandrov *
S
Shikhar Uttam
刘
刘杨 (Yang Liu)
DOI:10.1364/OL.36.003323delete
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摘要

摘要

En 中文
We introduce a new technique, spectral contrast imaging microscopy (SCIM), for super-resolution microscopic imaging. Based on a novel contrast mechanism that encodes each local spatial frequency with a corresponding optical wavelength, SCIM provides a real-time high-resolution spectral contrast microscopic image with superior contrast. We show that two microscopic objects, separated by a distance smaller than the diffraction limit of the optical system, can be spatially resolved in the SCIM image as different colors. Results with numerical simulation and experiments using a high-resolution United States Air Force target are presented. The ability of SCIM for imaging biological cells is also demonstrated. (C) 2011 Optical Society of America
Keyword:
WIDE-FIELD
HOLOGRAPHIC MICROSCOPY
HIGH-RESOLUTION
SUPERRESOLUTION
TISSUE

期刊

Optics Letters 封面图
Optics Letters
IF:
3.3
论文数:
4.0W
被引数:
7.6W

机构

P
pennsylvania commonwealth system of higher education (pcshe)
学者数:
12.9W
论文数: 11.7W
被引数: 177
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