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Standardizing Force Reconstruction in Dynamic Atomic Force Microscopy
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DOI：10.1021/acs.jpclett.5c03158.png)
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Abstract
En 中文
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which are critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction forces are not directly measured; they must be mathematically reconstructed from observables such as the amplitude, phase, or frequency shift. Many reconstruction techniques have been proposed over the last two decades, but they rely on different assumptions and have been applied inconsistently, limiting reproducibility and cross-study comparison. Here, we systematically evaluate major force reconstruction methods in both frequency- and amplitude-modulation AFM, detailing their theoretical foundations, performance regimes, and sources of error. To support benchmarking and reproducibility, we introduce an open-source software package that unifies all widely used methods, enabling side-by-side comparisons across different formulations. This work represents a critical step toward achieving consistent and interpretable AFM force spectroscopy, thereby supporting the more reliable application of AFM in fields ranging from materials science to biophysics.
Keywords:
FREQUENCY-SHIFTS
RESOLUTION
SURFACE
Journal
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