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Structured illumination diffraction phase microscopy for broadband, subdiffraction resolution, quantitative phase imaging
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DOI：10.1364/OL.39.001015.png)
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摘要
En 中文
Structured illumination microscopy (SIM) is an established technique that allows subdiffraction resolution imaging by heterodyning high sample frequencies into the system's passband via structured illumination. However, until now, SIM has been typically used to achieve subdiffraction resolution for intensity-based imaging. Here, we present a novel optical setup that uses structured illumination with a broadband light source to obtain noise-reduced, subdiffraction resolution, quantitative phase imaging (QPM) of cells. We compare this with a previous work for subdiffraction QPM imaging via SIM that used a laser source, and was thus still corrupted by coherent noise. (C) 2014 Optical Society of America
Keyword:
DIGITAL HOLOGRAPHIC MICROSCOPY
FLUORESCENCE MICROSCOPY
LIMIT
SUPERRESOLUTION
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IF:
3.3
论文数:
4.0W
被引数:
7.6W
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