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Thermally driven non-contact atomic force microscopy
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DOI：10.1063/1.2037197.png)
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In this letter a thermally driven frequency modulated atomic force microscopy (FM-AFM) technique is developed. Thermal fluctuations of the cantilever are employed to estimate the cantilever's equivalent resonant frequency. The corresponding cantilever oscillations are the smallest possible at a given temperature. Related experiments that establish the feasibility of thermally driven FM-AFM in ambient room conditions have achieved tip-sample separations less than 2 nm with long term separation stability (> 30 min). Employing this method a narrowband 250 Hz modulation of the tip-sample separation was detected with a vertical resolution of 0.25 angstrom in a 0.4 Hz bandwidth. The corresponding estimated force sensitivity is 7 fN. In all experiments the cantilever tip was maintained in the attractive regime of the tip-sample interactions. This demonstrates a thermally driven non-contact mode operation of AFM. It also provides a limits of performance study of small amplitude FM-AFM methods. (c) 2005 American Institute of Physics.
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3.6
论文数:
10.4W
被引数:
17.8W
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