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X-ray image reconstruction from a diffraction pattern alone
DOI:10.1103/PhysRevB.68.140101.png)
摘要
En 中文
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited three-dimensional images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial frequencies unavoidably lost in experiments. Diffractive imaging has thus previously been used to increase the resolution of images obtained by other means. Here we experimentally demonstrate an inversion method, which reconstructs the image of the object without the need for any such prior knowledge.
Keyword:
PHASE RETRIEVAL
ITERATIVE ALGORITHMS
OBJECT
CRYSTALLOGRAPHY
ELECTRON
SUPPORT
期刊
IF:
3.7
论文数:
15.4W
被引数:
41.0W
机构
暂无机构信息
引用论文
Electronic and optoelectronic properties of van der Waals heterostructure based on graphene-like GaN, blue phosphorene, SiC, and ZnO: A first principles study基于类石墨烯GaN,蓝色磷烯,SiC和ZnO的范德华异质结构的电子和光电性质: 第一性原理研究
Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffraction通过光学,x射线和电子衍射中的迭代方法进行相位恢复和无透镜成像

