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A High-Throughput True Random Number Generator Based on the Competitive Turn-On of OTS Devices
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DOI：10.1109/led.2026.3698689.png)
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Abstract
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Low-power, high-throughput true random number generators (TRNGs) are indispensable primitives for ensuring high security and reliability in edge-data encryption. In this work, we propose a TRNG that leverages competitive conduction between two InTe<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ovonic threshold switching (OTS) devices as an entropy source and extracts randomness through positive feedback in a CMOS cross-coupled pair. The proposed design achieves a throughput of 2.38 Mbps with an energy consumption of 483 pJ/bit. The randomness of the output bits is verified using the NIST SP800-22 and NIST SP800-90B statistical test suite. These results underscore the potential of the proposed TRNG for secure edge applications.
Keywords:
True random number generator
ovonic threshold switching
memristors
edge computing
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