arrow
Return

Appareo: Runtime Reliability Inspection for Deep Learning-Based Image Recognition Systems

delete2026-01-01
delete0
PRE
AI
刘会 cover
刘会 (Hui Liu) *
D
Du, Hongqin
W
Wen, Fujv
W
Wang, Jinghua
B
Bo Zhao
Z
Zhang, Ke *
DOI:10.1109/tase.2026.3730789delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
State-of-the-art (SOTA) deep learning (DL) models may still produce incorrect inferences without signaling uncertainty, limiting their reliability in safety- and quality-critical automation systems. From a software testing perspective, runtime inference reliability assessment for modern convolutional neural networks and Transformer-based image recognition models remains challenging due to the lack of effective test oracles and the limited scalability of existing approaches. This paper proposes Appareo, an unsupervised runtime reliability assessment framework for DL-based image recognition systems. Inspired by metamorphic testing (MT) principles, Appareo constructs semantics-preserving transformed inputs and evaluates inference consistency between original and transformed samples. To strengthen the runtime test oracle, Appareo further incorporates interpretation-consistency verification by comparing critical recognition regions extracted from heatmap-based visual interpretation techniques. Violations of prediction consistency or interpretation consistency are treated as indicators of unreliable inference behavior. We conduct extensive evaluations on large-scale image recognition tasks using convolutional-neural-network-based and Transformer-based models over the ImageNet and Caltech datasets. Experimental results show that Appareo achieves an F1 score of 0.77 for unintended abnormal sample detection and outperforms several SOTA adversarial detectors with an average AUC of 0.80 under diverse adversarial attacks. In addition, we evaluate Appareo in a real-world automated visual inspection scenario under both adversarial perturbations and environmental uncertainties. The results demonstrate that Appareo is an effective and scalable runtime reliability assessment framework for modern DL-based image recognition systems. Note to Practitioners-DL-based image recognition models are widely used in intelligent manufacturing and automated inspection systems, but they may produce unreliable predictions under environmental disturbances or adversarial perturbations. This work proposes an unsupervised runtime reliability assessment framework that verifies inference consistency under semantics-preserving input transformations. The framework jointly analyzes prediction consistency and interpretation consistency to identify potentially unreliable inference behaviors without requiring labeled deployment data or modifications to existing models. Experimental results on large-scale image classification tasks and a real-world automated visual inspection scenario demonstrate that the proposed approach can effectively detect unintended abnormal samples and adversarial perturbations while maintaining practical runtime overhead. The framework provides supplementary reliability signals before inference results are propagated to downstream control modules, supporting intelligent industrial automation and robotic perception systems.
Keywords:
Modeling
Runtime
Signal detection
Inspection
Image recognition
Visualization
Conferences
Forests
Labeling
Testing
Soft testing
reliability assessment
metamorphic testing
image recognition
adversarial detection

Journal

IEEE Transactions on Automation Science and Engineering cover
IEEE Transactions on Automation Science and Engineering
IF:
6.4
Papers:
5.2K
Citations:
1.6W

Organization

C
central china normal university
Scholars:
614
Papers: 200
Citations: 0
C
Chinese University of Hong Kong
Scholars:
510
Papers: 230
Citations: 0
W
wuhan university
Scholars:
3.5K
Papers: 1.1K
Citations: 0
researcher View more organizations
Cited Papers

Cited Papers

No cited papers available