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D
Du, Hongqin
central china normal university
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Appareo: Runtime Reliability Inspection for Deep Learning-Based Image Recognition Systems
IEEE Transactions on Automation Science and Engineering
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6.4
2026-01-01
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Liu, Hui; Du, Hongqin; Wen, Fujv; Wang, Jinghua; Zhao, Bo; Zhang, Ke
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B
Bo Zhao
H-index: 18 · Papers: 141
刘会
(Hui Liu)
H-index: 18 · Papers: 80
W
Wang, Jinghua
H-index: 0 · Papers: 1
Z
Zhang, Ke
H-index: 0 · Papers: 1
W
Wen, Fujv
H-index: 0 · Papers: 1
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