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Crop-paste and diffusion-based semi-supervised segmentation network for metal defect detection
DOI:10.1016/j.knosys.2025.113573.png)
Abstract
En 中文
Metal defect semantic segmentation is a crucial process for classifying and locating defects during the industrial production process, which holds paramount importance in elevating the quality of metal products. Recently, deep learning has exhibited impressive capabilities in identifying and segmenting defects on metal surfaces. However, the prevalent use of fully supervised segmentation techniques demands a substantial amount of annotated data for effective model training, which is hard to obtain in real scenarios. Additionally, most defects of metal products exhibit indistinct edge details, which hinders precise defect localization. In this study, a CropPaste and diffusion-based semi-supervised segmentation network (CPDNet) is proposed to identify pixel-level defects on metal surfaces by utilizing data that are both labeled and unlabeled. Firstly, a semi-supervised training method Crop-Paste is proposed to facilitate the learning of comprehensive semantic features from an extensive of unlabeled images and a restricted set of labeled images. Secondly, a frequency-directed diffusion model is proposed to recover high frequency features of defects to generate more accurate segmentation results. Lastly, an edge aware module is proposed in Sobel mean-teacher (M-T) UNet to improve the boundary information representation associated with defects. The experimental results on four datasets related to metal surface defects and a multimodal dataset show that CPDNet achieves a better performance in comparison with those state-of-the-art methods.
Keywords:
Metal defect detection
Defect segmentation
Semi-supervised learning
Diffusion model
Journal
K
IF:
7.6
Papers:
1.3W
Citations:
4.5W
Organization
No organization information available

