Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition

Zichang Tan

doi:10.1109/TIP.2021.3137005

Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition

2022-01-01

10

PRE

AI

DOI：10.1109/TIP.2021.3137005

Original

Original request for help

Save

Abstract

En 中文

In our daily life, a large number of activities require identity verification, e.g., ePassport gates. Most of those verification systems recognize who you are by matching the ID document photo (ID face) to your live face image (spot face). The ID vs. Spot (IvS) face recognition is different from general face recognition where each dataset usually contains a small number of subjects and sufficient images for each subject. In IvS face recognition, the datasets usually contain massive class numbers (million or more) while each class only has two image samples (one ID face and one spot face), which makes it very challenging to train an effective model (e.g., excessive demand on GPU memory if conducting the classification on such massive classes, hardly capture the effective features for bisample data of each identity, etc.). To avoid the excessive demand on GPU memory, a two-stage training method is developed, where we first train the model on the dataset in general face recognition (e.g., MS-Celeb-1M) and then employ the metric learning losses (e.g., triplet and quadruplet losses) to learn the features on IvS data with million classes. To extract more effective features for IvS face recognition, we propose two novel algorithms to enhance the network by selecting harder samples for training. Firstly, a Cross-Batch Hard Example Mining (CB-HEM) is proposed to select the hard triplets from not only the current mini-batch but also past dozens of mini-batches (for convenience, we use batch to denote a mini-batch in the following), which can significantly expand the space of sample selection. Secondly, a Pseudo Large Batch (PLB) is proposed to virtually increase the batch size with a fixed GPU memory. The proposed PLB and CB-HEM can be employed simultaneously to train the network, which dramatically expands the selecting space by hundreds of times, where the very hard sample pairs especially the hard negative pairs can be selected for training to enhance the discriminative capability. Extensive comparative evaluations conducted on multiple IvS benchmarks demonstrate the effectiveness of the proposed method.

Keywords:

Face recognition

Training

Measurement

Graphics processing units

Deep learning

Logic gates

Feature extraction

Face recognition

ID vs spot

deep learning

cross-batch hard example mining

pseudo large batch

Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition

Abstract

Journal

Organization